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EMD 2011-10-21
12:35		 Tokyo Tachikawa-Shiminn-kaikan Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) --
Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57		 Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more] EMD2011-57
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