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EMCJ 2012-04-20
15:10		 Ishikawa Kanazawa Univ. Integrated evaluation of on-board and on-chip power noise measurement results in digital LSI
Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Makoto Nagata (Kobe Univ.) EMCJ2012-7		 In recent LSI system designs, noise environment of LSI system is getting worse.
Therefore proper noise oriented design ... [more]		 EMCJ2012-7
pp.37-42
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