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Committee
Date Time
Place
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Abstract
Paper #
VLD
,
ICD
,
DC
,
IPSJ-SLDM
2005-12-02
09:55
Fukuoka
Kitakyushu International Conference Center
A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits
Tsuyoshi Iwagaki
(
JAIST
),
Satoshi Ohtake
,
Hideo Fujiwara
(
NAIST
)
This paper presents a broadside test generation method for
transition faults in partial scan circuits. In order to gene...
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VLD2005-77
ICD2005-172
DC2005-54
pp.7-12
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