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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]		 2018-12-07
14:35		 Hiroshima Satellite Campus Hiroshima Analysis of Conductive Power Noise Characteristics in Digital IC Chips between two Different IC Packaging Structures
Akihiro Tsukioka, Kosuke Jike, Koh Watanabe, Noriyuki Miura, Makoto Nagata (Kobe Univ.) CPM2018-96 ICD2018-57 IE2018-75		 The conducted and radiated emission are caused by the dynamic power consumption in digital circuit operations. The chara... [more] CPM2018-96 ICD2018-57 IE2018-75
pp.37-42
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