|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 10:30 |
Miyazaki |
NewWelCity Miyazaki |
Immunity Evaluation of SRAM Core Using DPI with On-Chip Diagnosis Structures Takuya Sawada, Taku Toshikawa, Kumpei Yoshikawa (Kobe Univ.), Hidehiro Takata, Koji Nii (Renesas Electronics Corp.), Makoto Nagata (Kobe Univ.) CPM2011-165 ICD2011-97 |
[more] |
CPM2011-165 ICD2011-97 pp.85-90 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|