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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2013-02-13
16:40
Tokyo Kikai-Shinko-Kaikan Bldg. Data volume reduction method for unknown value handling in built-in self test used in field
Yuta Yoshimi (NAIST), Kazumi Hatayama, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue (NAIST/JST)
Many approaches on test pattern compression targeted unknown value handling. It is because unknown values have impacts o... [more] DC2012-90
pp.61-66
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