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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 63 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2013-11-28
10:30
Kagoshima   On Synthesis Algorithm for Parallel Index Generator Units
Yusuke Matsunaga (Kyushu Univ.) VLD2013-88 DC2013-54
The index generation function is a multi-valued logic function which checks if the given input vector is a registered or... [more] VLD2013-88 DC2013-54
pp.203-208
SIP, CAS, MSS, VLD 2013-07-11
17:40
Kumamoto Kumamoto Univ. An Area and Delay Efficient Implementation of The Index Generation Functions
Yusuke Matsunaga (Kyushu Univ.) CAS2013-15 VLD2013-25 SIP2013-45 MSS2013-15
 [more] CAS2013-15 VLD2013-25 SIP2013-45 MSS2013-15
pp.77-82
DC 2013-02-13
10:25
Tokyo Kikai-Shinko-Kaikan Bldg. Accelerating techniques for SAT-based test pattern generation
Yusuke Matsunaga (Kyushu Univ.) DC2012-81
A naive way to solve ATPG problem using SAT solver is to formulate a test generation problem for a fault at a time.
Thi... [more]
DC2012-81
pp.7-12
DC 2013-02-13
15:05
Tokyo Kikai-Shinko-Kaikan Bldg. An Evaluatoin Method of Test Compactors for Secure
Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) DC2012-87
 [more] DC2012-87
pp.43-47
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-27
14:15
Fukuoka Centennial Hall Kyushu University School of Medicine A novel efficient data structure representing shared DAG patterns
Yusuke Matsunaga (Kyushu Univ.) VLD2012-86 DC2012-52
Technology mapping and local rewriting in logic synthesis use many small size DAG patterns. Even though they share the i... [more] VLD2012-86 DC2012-52
pp.159-162
VLD, CAS, MSS, SIP 2012-07-02
14:10
Kyoto Kyoto Research Park An Evaluation of Heuristic Fault Simulation Algorithms for Transient Faults in Sequential Circuits
Taiga Takata, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) CAS2012-10 VLD2012-20 SIP2012-42 MSS2012-10
 [more] CAS2012-10 VLD2012-20 SIP2012-42 MSS2012-10
pp.55-60
VLD, CAS, MSS, SIP 2012-07-02
14:50
Kyoto Kyoto Research Park On efficiently computing of indirect implications
Yusuke Matsunaga (Kyushu Univ.) CAS2012-12 VLD2012-22 SIP2012-44 MSS2012-12
 [more] CAS2012-12 VLD2012-22 SIP2012-44 MSS2012-12
pp.67-72
VLD 2012-03-07
10:05
Oita B-con Plaza An Efficient Method to Analyze Logic Masking Effects of Soft Errors in Sequential Circuits
Taiga Takata, Yusuke Matsunaga (Kyushu Univ.) VLD2011-134
 [more] VLD2011-134
pp.85-90
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
13:50
Miyazaki NewWelCity Miyazaki Ymtools: an infrastructure for research and development of logic synthesis and verification
Yusuke Matsunaga (Kyushu Univ.) VLD2011-78 DC2011-54
 [more] VLD2011-78 DC2011-54
pp.153-158
VLD 2011-09-27
10:45
Fukushima University of Aizu A statistical evaluation of approximate methods for soft error tolerance analysis of combinational circuits
Hidenori Ayabe, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) VLD2011-49
An approximate method which evaluates soft error tolerance with sampling has been proposed. There is an method to evalua... [more] VLD2011-49
pp.49-54
RECONF, VLD, CPSY, IPSJ-SLDM [detail] 2011-01-17
13:50
Kanagawa Keio Univ (Hiyoshi Campus) A Heuristic Method using CODCs for Extraction of Maximum Observability Don't Care Set
Taiga Takata, Yusuke Matsunaga (Kyushu Univ.) VLD2010-91 CPSY2010-46 RECONF2010-60
Sets of observability don't cares (ODCs) can be employed for multi-level logic optimization or propagation analysis of p... [more] VLD2010-91 CPSY2010-46 RECONF2010-60
pp.43-48
VLD 2010-09-28
15:50
Kyoto Kyoto Institute of Technology Modeling of Latching Probability of Soft-Error-Induced Pulse
Motoharu Hirata, Masayoshi Yoshimura, Yusuke Matsunaga (Kyusyu Univ.) VLD2010-56
This paper describes soft error which is one of the dependability decrease factors of LSI(Large Scale Integrated circuit... [more] VLD2010-56
pp.83-88
VLD, IPSJ-SLDM 2010-05-19
16:10
Fukuoka Kitakyushu International Conference Center Highly Accurate Approximate Methods for Soft Error Tolerance Estimation for Sequential Circuits
Naoki Shirobayashi, Yusuke Akamine, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) VLD2010-2
Soft error tolerance estimation method is necessary for soft error
aware logic designs. There is an exact method has b... [more]
VLD2010-2
pp.25-30
VLD, IPSJ-SLDM 2010-05-19
16:35
Fukuoka Kitakyushu International Conference Center An Approximate Method for Steady State Probability Calculation based on FSM Splitting
So Hasegawa, Yusuke Akamine, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) VLD2010-3
An exact method evaluate soft error tolerance with Markov model
has been proposed. This method, however, is difficult t... [more]
VLD2010-3
pp.31-36
VLD 2010-03-12
13:55
Okinawa   An Acceleration of Soft Error Torelance Estimation Method for Sequential Circuits by Reducing the Number of States
Yusuke Akamine, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) VLD2009-126
Soft error tolerance estimation method is necessary for the soft error aware logic design. We proposed an estimation met... [more] VLD2009-126
pp.163-168
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-03
10:00
Kochi Kochi City Culture-Plaza An Evaluation of Approximate Methods for Soft Error Tolerance Evaluation of Sequential Circuits
Yusuke Akamine, Masayoshi Yoshimura, Yusuke Matsunaga (Kyushu Univ.) VLD2009-49 DC2009-36
Soft error tolerance evaluation method is necessary for the soft error aware logic design. An evaluation method with Mar... [more] VLD2009-49 DC2009-36
pp.55-60
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-04
15:40
Kochi Kochi City Culture-Plaza FlexMerge: A Logic Optimization Technique to Minimize Area for LUT-based FPGAs
Taiga Takata, Yusuke Matsunaga (Kyushu Univ.) VLD2009-68 DC2009-55
This paper presents a novel logic optimization technique to minimize the number of LUTs for the post-processing of LUT-b... [more] VLD2009-68 DC2009-55
pp.185-190
VLD 2009-09-24
15:50
Osaka Osaka University On accelleration of SER analysis for sequential circuits using implicit enumeration
Yusuke Matsunaga, Yusuke Akamine (Kyushu Univ.) VLD2009-34
 [more] VLD2009-34
pp.31-36
DC, CPSY 2009-04-21
13:50
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Fast Soft Error Rate Estimation for Circuits Containing Arithmetic Units
Motoharu Hirata, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura (Kyushu Univ.) CPSY2009-5 DC2009-5
This paper describes soft errors which are errors in LSI that are due to external radiation.The soft error rate (SER) wh... [more] CPSY2009-5 DC2009-5
pp.25-30
DC, CPSY 2009-04-21
16:10
Tokyo Akihabara Satellite Campus, Tokyo Metropolitan Univ. Pulse Generation Analysis for SER Estimation Targeted to Cell-based Design.
Daisuke Kozuwa, Masayoshi Yoshimura, Yusuke Matsunaga (Kyusyu Univ.) CPSY2009-8 DC2009-8
The charge deposition that results from a neutron strikes to a transistor alter the memory state or the logic state of o... [more] CPSY2009-8 DC2009-8
pp.43-48
 Results 21 - 40 of 63 [Previous]  /  [Next]  
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