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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, ITE-IST |
2011-07-22 10:25 |
Hiroshima |
Hiroshima Institute of Technology |
Analysis Methods of Substrate Sensitivity in an Analog Circiut Satoshi Takaya, Yoji Bando (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) ICD2011-28 |
Substrate noise sensitivity of an analog circuit consists of the sensitivity of a device and noise propagation from the ... [more] |
ICD2011-28 pp.73-78 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 11:20 |
Fukuoka |
Kyushu University |
A Consideration of Substrate Noise Sensitivity of Analog Elements Satoshi Takaya, Yoji Bando, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) CPM2010-126 ICD2010-85 |
Measure substrate sensitivity of differential amplifiers in a 90 nm CMOS technology with more than 32 different geometor... [more] |
CPM2010-126 ICD2010-85 pp.13-17 |
ICD, ITE-IST |
2010-07-22 10:20 |
Osaka |
Josho Gakuen Osaka Center |
In-situ Evaluation of Vth and AC Gain of 90 nm CMOS Differential Pair Transistors Yoji Bando, Satoshi Takaya, Takashi Hasegawa (Kobe Univ.), Toru Ohkawa, Masaaki Souda, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete), Makoto Nagata (Kobe Univ.) ICD2010-23 |
[more] |
ICD2010-23 pp.11-14 |
ICD |
2009-12-14 13:30 |
Shizuoka |
Shizuoka University (Hamamatsu) |
[Poster Presentation]
Simulation of Substrate Noise Impact on CMOS Analog Circuit Satoshi Takaya, Yoji Bando, Makoto Nagata (Kobe Univ.) ICD2009-81 |
We have measured and simulated substrate noise impact on basic analog amplifier using 90-nm CMOS test chip. To measure s... [more] |
ICD2009-81 pp.31-34 |
ICD, ITE-IST |
2009-10-01 10:00 |
Tokyo |
CIC Tokyo (Tamachi) |
Evaluation and Analysis of Substrate Noise in Microprocessor Yoji Bando (Kobe Univ.), Daisuke Kosaka (A-R-Tec), Goichi Yokomizo, Kunihiko Tsuboi (STARC), Ying Shiun Li, Shen Lin (Apache), Makoto Nagata (Kobe Univ./A-R-Tec) ICD2009-35 |
An integrated power and substrate noise analysis environment targeting systems-on-chip (SoC) design was verified through... [more] |
ICD2009-35 pp.11-14 |
ICD, VLD |
2007-03-07 17:00 |
Okinawa |
Mielparque Okinawa |
On-chip monitoring for sub-100-nm digital signal integrity Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.) |
A compact on-chip signal monitor circuit uses voltage mode sensing by a source follower circuit with small input device ... [more] |
VLD2006-116 ICD2006-207 pp.61-66 |
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