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All Technical Committee Conferences (Searched in: All Years)
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| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| MW, ED |
2007-01-19
15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Current collapse of inslated-gate GaN-HEMT
Masahito Kanamura, Toshihiro Ohki, Kenji Imanishi, Kozo Makiyama, Naoya Okamoto (Fujitsu, Fujitsu Labs.), Naoki Hara (Fujitsu Labs.), Toshihide Kikkawa, Kazukiyo Joshin (Fujitsu, Fujitsu Labs.) |
[more] |
ED2006-236 MW2006-189
pp.199-203 |
| MW, ED |
2007-01-19
16:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
GaN-HEMT with high breakdown voltage and high fmax for millimeter-wave application
Kozo Makiyama, Toshihiro Ohki, Kenji Imanishi, Masahito Kanamura (Fujitsu, Fujitsu Labs.), Naoki Hara (Fujitsu Labs.), Toshihide Kikkawa (Fujitsu, Fujitsu Labs.) |
[more] |
ED2006-239 MW2006-192
pp.213-217 |
| MW, ED |
2005-01-18
15:50 |
Tokyo |
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Yusuke Inoue, Masaru Sato, Toshihiro Ohki, Kozo Makiyama, Tsuyoshi Takahashi, Hisao Shigematsu, Tatsuya Hirose (Fujitsu Lab.) |
[more] |
ED2004-224 MW2004-231
pp.71-76 |
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