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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 16:30 |
Fukuoka |
Kitakyushu Science and Research Park |
Evaluating the reliability of Highly Reliable Cell Circuits Keiichi Hotta, Takashi Nakada, Masaki Nakanishi, Shigeru Yamashita, Yasuhiko Nakashima (Nara Institute of Science and Technology) VLD2008-75 DC2008-43 |
Recently, the shrinking process causes transistor variation and growth of error rate. Highly Reliable Cells (HRCs) have ... [more] |
VLD2008-75 DC2008-43 pp.91-96 |
DC, CPSY, IPSJ-SLDM, IPSJ-EMB |
2008-03-28 13:50 |
Kagoshima |
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A Functional Unit with Small Variety of Highly Reliable Cells and Its Evaluation Kazunori Suzuki, Takashi Nakada, Masaki Nakanishi, Shigeru Yamashita, Yasuhiko Nakashima (NAIST) DC2007-112 CPSY2007-108 |
Recently, the shrinking process causes growth of error rate. We have proposed new standard cells in which transistors ar... [more] |
DC2007-112 CPSY2007-108 pp.167-172 |
VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-22 09:00 |
Fukuoka |
Kitakyushu International Conference Center |
Designing Soft Error Tolerant LUTs of SRAM-based FPGAs Kohei Satoyama, Takashi Nakada, Masaki Nakanishi, Shigeru Yamashita, Yasuhiko Nakashima (NAIST) RECONF2007-43 |
Recently, soft error becomes a serious problem as the process shrinks. Especially, SRAMs seriously suffer from soft erro... [more] |
RECONF2007-43 pp.1-6 |
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