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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2023-12-22 13:50 |
Tochigi | Teikyo University | Application of electron/ion emission equivalent circuit as a compass in investigation for accidents caused by arc discharge Noboru Wakatsuki (Ishinomaki Senshu Univ.), Katsuhiro Hosoe (Administrative scrivener), Shuhei Suzuki (consultant), Yu Yonezawa (Nagoya Univ.)  EMD2023-34 |
Electrical accidents related to arc discharge are complex phenomena. In most cases, there is no map that shows a clear p... [more] | EMD2023-34 pp.13-18 |
| LQE, OPE, CPM, EMD, R | 2023-08-25 13:50 |
Miyagi | Tohoku university (Primary: On-site, Secondary: Online) |
Hypothetic model of electron and ion emission due to an electric double layer at the interface between solid and liquid phases at electrical contacts Noboru Wakatsuki (Ishinomaki Senshu Univ.), Katuhiro Hosoe (Administrative scrivener), Shuhei Suzuki, Yu Yonezawa (Nagoya Univ.) R2023-34 EMD2023-29 CPM2023-39 OPE2023-78 LQE2023-25 |
We want to analyze the current interruption phenomenon of electric contacts, that accompanies melting and arc discharge,... [more] | R2023-34 EMD2023-29 CPM2023-39 OPE2023-78 LQE2023-25 pp.89-94 |
| WPT, EMCJ, EMD (Joint) |
2023-07-21 15:00 |
Tokyo | (Primary: On-site, Secondary: Online) |
Hypothetic model of solid/liquid interfacial electric double layer for electric contact Noboru Wakatsuki (Ishinomaki Senshu Univ), Katuhiro Hosoe (Administrative scrivener), Shuhei Suzuki (Consultant), Yu Yonezawa (Nagoya Univ) EMD2023-12 |
This paper proposes an electric circuit model to analyze the physical phenomena at the electric contact during the break... [more] | EMD2023-12 pp.13-18 |
| VLD, HWS (Joint) |
2018-03-01 09:25 |
Okinawa | Okinawa Seinen Kaikan | Efficient Generation of Lithography Hotspot Detector based on Transfer Learning Shuhei Suzuki, Yoichi Tomioka (UoA) VLD2017-106 |
As semiconductor features shrink in size, the fidelity of the layout pattern transferred onto the wafer decreases. A layo... [more] | VLD2017-106 pp.103-108 |
| ED, LQE, CPM | 2015-11-26 10:55 |
Osaka | Osaka City University Media Center | Growth of AlN with annealing on different misoriented c-plane sapphire Shuhei Suzuki, Chia-Hung Lin, Hideto Miyake, Kazumasa Hiramatsu (Mie Univ.), Hiroyuki Fukuyama (Tohoku Univ.) ED2015-69 CPM2015-104 LQE2015-101 |
AlN is promising for applications in the deep ultraviolet region because of its wide direct band-gap and excellent therm... [more] | ED2015-69 CPM2015-104 LQE2015-101 pp.5-9 |
| CPM, LQE, ED | 2013-11-29 11:25 |
Osaka | Annealing in N2-CO of AlN buffer layers on sapphire and high temperature growth of AlN layers by MOVPE Gou Nishio, Shuhei Suzuki, Hideto Miyake, Kazumasa Hiramatsu (Mie Univ.), Hiroyuki Fukuyama (Tohoku Univ.) ED2013-80 CPM2013-139 LQE2013-115 |
AlN has attracted attention for applications in the deep ultraviolet region, because of its wide direct band-gap and exc... [more] | ED2013-80 CPM2013-139 LQE2013-115 pp.75-78 |
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