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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 41 - 60 of 75 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2009-12-14
13:30
Shizuoka Shizuoka University (Hamamatsu) [Poster Presentation] Design Technology of stacked NAND type MRAM
Shouto Tamai, Shigeyoshi Watanabe (Shonan Inst. of Tech.) ICD2009-79
Design technology of stacked type MRAM using spin transistor has been described. Using 64 layer level cell structure fea... [more] ICD2009-79
pp.19-23
ICD 2009-12-14
13:30
Shizuoka Shizuoka University (Hamamatsu) [Poster Presentation] Design Technology of stacked NAND type 1-transistor FeRAM
Koichi Sugano, Shigeyoshi Watanabe (Shonan Inst. of Tech) ICD2009-80
 [more] ICD2009-80
pp.25-29
ICD, SDM 2009-07-17
09:30
Tokyo Tokyo Institute of Technology Study of stacked NAND type 1-transistor FeRAM
Koichi Sugano, Shigeyoshi Watanabe (Shonan Inst. of Tech.) SDM2009-108 ICD2009-24
 [more] SDM2009-108 ICD2009-24
pp.57-62
ICD, SDM 2009-07-17
09:55
Tokyo Tokyo Institute of Technology Study of stacked NAND type MRAM for universal memory
Shouto Tamai, Shigeyoshi Watanabe (Shonan Inst. of Tech.) SDM2009-109 ICD2009-25
 [more] SDM2009-109 ICD2009-25
pp.63-68
ICD 2009-04-14
15:25
Miyagi Daikanso (Matsushima, Miyagi) Reading method of NAND type 1-transistor FeRAM with pulse input
Koichi Sugano, Shigeyoshi Watanabe (Shonan Inst. of Tech.) ICD2009-11
 [more] ICD2009-11
pp.53-57
ICD 2009-04-14
15:50
Miyagi Daikanso (Matsushima, Miyagi) Study for Design Technology of stacked NAND type MRAM using spin transistor
Shouto Tamai, Shigeyoshi Watanabe (Shonan Inst. of Tech.) ICD2009-12
 [more] ICD2009-12
pp.59-64
VLD 2009-03-13
14:50
Okinawa   Study of high-speed low-power system LSI for sub-threshold operation
Makoto Tsurukubo, Shigeyoshi Watanabe (Shonan Inst. of Tech Graduate school) VLD2008-166
The effect of a basic inverter circuit that applied the DTMOS operation method to the Sub-threshold operation area by us... [more] VLD2008-166
pp.237-241
VLD 2009-03-13
15:15
Okinawa   Reduced pattern area technology of 3D transistor for system LSI
Yu Hiroshima, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2008-167
We designed 1 bit Full Adder with FinFET, Double-Gate transistor. FinFET, Double-Gate transistor, Stacked type transisto... [more] VLD2008-167
pp.243-248
VLD 2009-03-13
15:40
Okinawa   Examination of Low-power system LSI architecture by scheduling algorithm
Yoshikazu Sato, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2008-168
Reduction of power consumption of system LSI with scheduling algorithm has been described. Using CDFG the effect of powe... [more] VLD2008-168
pp.249-254
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-17
15:25
Fukuoka Kitakyushu Science and Research Park Adaptive routing of the 2-D torus network based on a Turn model
Kazuya Matoyama, Yasuyuki Miura, Shigeyoshi Watanabe (Shonan Institute of Technology) RECONF2008-43
 [more] RECONF2008-43
pp.27-32
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-17
15:50
Fukuoka Kitakyushu Science and Research Park Hardware Implementation Costs of Adaptive Routing in the Hierarchical Interconnection Network
Masahiro Kaneko, Yasuyuki Miura, Shigeyoshi Watanabe (Shonan Institute of Technology) RECONF2008-44
By progress of VLSI technology, "On-Chip-Multiprocessor" which processes in parallel on a wafer has been realized, and a... [more] RECONF2008-44
pp.33-38
ICD, SDM 2008-07-17
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. New design technology of Independent-Gate controlled Stacked type 3D transistor for system LSI
Yu Hiroshima, Shigeyoshi Watanabe (SIT) SDM2008-137 ICD2008-47
 [more] SDM2008-137 ICD2008-47
pp.53-58
ICD, SDM 2008-07-18
09:00
Tokyo Kikai-Shinko-Kaikan Bldg. Study of high-Speed low-power system LSI for sub-threshold operation
Makoto Tsurukubo, Shigeyoshi Watanabe (SIT) SDM2008-139 ICD2008-49
 [more] SDM2008-139 ICD2008-49
pp.65-70
ICD, SDM 2008-07-18
09:25
Tokyo Kikai-Shinko-Kaikan Bldg. Examination of Low-power system LSI architecture by Real time scheduling
Yoshikazu Sato, Shigeyoshi Watanabe (SIT) SDM2008-140 ICD2008-50
Reduction of power consumption of system LSI with fixed priority scheduling has been described. Scheme of power supply f... [more] SDM2008-140 ICD2008-50
pp.71-76
ICD, SDM 2008-07-18
14:15
Tokyo Kikai-Shinko-Kaikan Bldg. Realistic future trend of non-voltile semiconductor memory and feasibility study of ultra-low-cost high-speed universal non-volatile memory -- feasibility study of BiCS type FeRAM and MRAM --
Shigeyoshi Watanabe, Koichi Sugano, Shouto Tamai (Shonan Institute of Tech.) SDM2008-145 ICD2008-55
 [more] SDM2008-145 ICD2008-55
pp.97-102
ICD 2008-04-18
16:10
Tokyo   Realistic future trend of non-volatile semiconductor memory and feasibility study of ultra-low-cost high-speed universal non-volatile memory -- feasibility study of BiCS type FeRAM --
Shigeyoshi Watanabe (Shonan Institute of Tech.) ICD2008-16
 [more] ICD2008-16
pp.83-88
SDM 2008-03-14
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Realistic future trend of advanced non-volatile memory and feasibility study of ultra-low-cost high-speed universal non-volatile memory
Shigeyoshi Watanabe (SIT) SDM2007-278
 [more] SDM2007-278
pp.27-32
SDM 2008-03-14
16:15
Tokyo Kikai-Shinko-Kaikan Bldg. New design technology of independent-gate controlled Double-Gate transistor for LSI
Yu Hiroshima, Keisuke Okamoto, Shigeyoshi Watanabe (Shonan Inst. of Tech.) SDM2007-279
 [more] SDM2007-279
pp.33-38
VLD, ICD 2008-03-06
16:35
Okinawa TiRuRu Comparison of Power consumption between dynamic voltage scheme and multi-supply voltage scheme for system LSI
Satoshi Hanami, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2007-155 ICD2007-178
Reduction of power dissipation caused by dynamic current, gate leakage current, and subthreshold leakage current of mult... [more] VLD2007-155 ICD2007-178
pp.67-72
VLD, ICD 2008-03-07
16:10
Okinawa TiRuRu New technology of independent-gate controlled Double-Gate transistor for system LSI
Yu Hiroshima, Keisuke Okamoto, Keisuke Koizumi, Shigeyoshi Watanabe (Shonan Inst. of Tech.) VLD2007-168 ICD2007-191
New design technology of independent-gate controlled Double-Gate transistor realized high density design more than FinFE... [more] VLD2007-168 ICD2007-191
pp.69-74
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