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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-12-01 11:25 |
Fukuoka |
Kyushu University |
A Sequential Test Generation Method and a Binding Method for Testability Using Behavioral Description Ryoichi Inoue, Hiroaki Fujiwara, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (NAIST) VLD2010-76 DC2010-43 |
Although many works on test generation algorithms for sequential circuits have been reported so far, it is still very ha... [more] |
VLD2010-76 DC2010-43 pp.143-148 |
DC |
2008-02-08 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Test Generation Methods for State Observable FSMs to Increase Defect Coverage Under Test Length Constraint Ryoichi Inoue, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (NAIST) DC2007-78 |
We proposed a fault-independent test generation method for logical fault testing of state-observable FSMs and a fault-de... [more] |
DC2007-78 pp.69-76 |
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