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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2021-10-21
16:25		 Online Online Statistical analysis of RTN behavior on transistor structure, operating region, and carrier transport direction
Ryo Akimoto, Rihito Kuroda, Takezo Mawaki, Shigotoshi Sugawa (Tohoku Univ.) SDM2021-52		  [more] SDM2021-52
pp.27-32
SDM 2020-10-22
15:50		 Online Online Effect of Drain-to-Source Voltage on Random Telegraph Noise Based on Statistical Analysis
Ryo Akimoto, Rihito Kuroda (Tohoku Univ.), Akinobu Teramoto (Hiroshima Univ.), Takezo Mawaki, Shinya Ichino, Tomoyuki Suwa, Shigetoshi Sugawa (Tohoku Univ.) SDM2020-21		 In this work, temporal noise characteristics of 11520 MOSFETs were measured for each of rectangular and trapezoidal shap... [more] SDM2020-21
pp.34-39
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