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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM, ITE-IST [detail] |
2016-08-03 09:45 |
Osaka |
Central Electric Club |
[Invited Talk]
A ReRAM-based Physically Unclonable Function with Bit Error Rate < 0.5% after 10 years at 125°C for 40nm embedded application Yuhei Yoshimoto, Yoshikazu Katoh, Satoru Ogasahara, Zhiqiang Wei, Kazuyuki Kouno (Panasonic Semiconductor Solutions Co., Ltd.) SDM2016-61 ICD2016-29 |
This paper presents a secure application—a physically unclonable function (PUF)—that uses the physical prope... [more] |
SDM2016-61 ICD2016-29 pp.89-94 |
ICD |
2016-04-14 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Lecture]
Reliability Projecting for ReRAM based on Stochastic Differential Equation Zhiqiang Wei (PSCS), Koji Eriguchi (Kyoto Univ.), Shunsaku Muraoka, Koji Katayama, Ryotaro Yasuhara, Kawai Ken, Yukio Hayakawa, Kazuhiko Shimakawa, Takumi Mikawa, Yoneda Shinichi (PSCS) ICD2016-7 |
An analytic formula based on stochastic differential equation is successfully developed to describe intrinsic ReRAM vari... [more] |
ICD2016-7 pp.33-37 |
SDM, ICD |
2015-08-24 09:30 |
Kumamoto |
Kumamoto City |
[Invited Talk]
Highly Reliable TaOx ReRAM with Centralized Filament for 28-nm Embedded Application Yukio Hayakawa, Atsushi Himeno, Ryutaro Yasuhara, Satoru Fujii, Satoru Ito, Yoshio Kawashima, Yuuichirou Ikeda, Akifumi Kawahara, Ken Kawai, Zhiqiang Wei, Shunsaku Muraoka, Kazuhiko Shimakawa, Takumi Mikawa, Shinichi Yoneda (Panasonic) SDM2015-57 ICD2015-26 |
For 28-nm embedded application, we have proposed a TaOx-based ReRAM with precise filament positioning and high thermal s... [more] |
SDM2015-57 ICD2015-26 pp.1-5 |
ICD |
2013-04-11 11:40 |
Ibaraki |
Advanced Industrial Science and Technology (AIST) |
[Invited Talk]
Filament Scaling Forming Technique and Level-Verify-Write Scheme with Endurance Over 10 million Cycles in ReRAM Akifumi Kawahara, Ken Kawai, Yuuichirou Ikeda, Yoshikazu Katoh, Ryotaro Azuma, Yuhei Yoshimoto, Kouhei Tanabe, Zhiqiang Wei, Takeki Ninomiya, Koji Katayama, Shunsaku Muraoka, Atsushi Himeno, Kazuhiko Shimakawa, Takeshi Takagi, Kunitoshi Aono (Panasonic) ICD2013-4 |
Endurance characteristics over 10 million cycles almost 10 times higher as existing, and the small filament for leading ... [more] |
ICD2013-4 pp.15-20 |
TL |
2012-07-22 15:00 |
Yamagata |
Yamagata University |
The Quicker, the Better? L2 Proficiency, Reaction Time, and Brain Activation Shin'ichiro Ishikawa (Kove Univ.), Qiang Wei (NICT) TL2012-24 |
(Advance abstract in Japanese is available) [more] |
TL2012-24 pp.79-84 |
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