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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, EST | 2014-09-12 13:00 |
Hokkaido | Kitami Inst. Technology | Estimation Method of Packet Error Rate Considering Pulse Duration of Burst Disturbance Kazuhiro Takaya (NTT), Daisuke Tomita, Kouki Umeda, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.)  EMCJ2014-36 EST2014-50 |
[more] | EMCJ2014-36 EST2014-50 pp.29-34 |
| EMCJ | 2014-07-10 13:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Packet Error Rate Estimation of Direct-Sequence Spread-Spectrum Communication System Considering Frequency of a Narrow-Band Disturbance Daisuke Tomita, Kouki Umeda (Kyoto Univ.), Kazuhiro Takaya (NTT/Kyoto Univ.), Masakatsu Ogawa (Sophia Univ.), Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2014-17 |
A method to estimate the degree of quality degradation of digital wireless communication by measuring amplitude probabil... [more] | EMCJ2014-17 pp.1-6 |
| MW | 2014-05-22 16:45 |
Kyoto | Doshisha Univ. | Expression of Power Flow with Electromagnetic Potential in Traveling Current Model Takashi Hisakado, Akira Hagirawa, Osami Wada (Kyoto Univ.) MW2014-35 |
[more] | MW2014-35 pp.67-72 |
| EMCJ | 2013-07-11 12:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Impedance Balance Control for Suppression of Substrate Noise Coupling in CMOS IC Masaaki Maeda, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ) EMCJ2013-30 |
Simultaneous switching current generated by operation of a CMOS circuit is injected into the CMOS substrate, and causes ... [more] | EMCJ2013-30 pp.15-20 |
| EMCJ | 2013-07-11 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Reducing Common-Mode Noise of Power Converter Using Impedance Balance Method. Atsuhiro Takahashi, Hiroshi Tsukada, Takashi Kojima, Yoshiyuki Hattori (TOYOTA Central Labs.), Tsuyoshi Funaki (Osaka Univ.), Osami Wada (Kyoto Univ.) EMCJ2013-35 |
This study discusses the generating mechanism of the common-mode voltage in FM-radio band at the input terminal of a ste... [more] | EMCJ2013-35 pp.45-50 |
| EMCJ, IEE-EMC | 2013-06-21 10:00 |
Kyoto | Kyoto Univ. | Imbalance Control for Reduction of Common-Mode Generation at Differential Transmission Line Bend Tohlu Matsushima, Osami Wada (Kyoto Univ.) EMCJ2013-17 |
[more] | EMCJ2013-17 pp.5-10 |
| EMCJ, IEE-EMC | 2013-06-21 16:45 |
Kyoto | Kyoto Univ. | [Special Talk]
EMC of Semiconductor Integrated Circuits
-- Macro-modeling and International Standardization -- Osami Wada (Kyoto Univ.) EMCJ2013-26 |
[more] | EMCJ2013-26 pp.81-86 |
| MW | 2013-05-30 16:45 |
Kyoto | Ryukoku Univ. | Equivalent Circuit of Metamaterial Composed of Conducting Spheres Connected by Conducting Wires Takashi Hisakado, Keisuke Yoshida, Osami Wada (Kyoto Univ.) MW2013-14 |
[more] | MW2013-14 pp.23-28 |
| EMCJ | 2013-04-12 13:45 |
Okayama | Okayama Univ. | Improvement of Reproducibility of DPI Method to Quantify RF Conducted Immunity of Voltage Regulator Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2013-4 |
In recent years, immunity of a voltage regulator which supplies constant voltage to electronic circuits becomes increas... [more] |
EMCJ2013-4 pp.19-24 |
| EST, EMCJ, IEE-EMC [detail] | 2012-10-25 13:35 |
Miyagi | Tohoku Gakuin University(Tagajo Campus) | LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current Ayumu Izuhara, Teruyoshi Yamasaki, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2012-69 EST2012-53 |
For simulating high-frequency power-supply currents generated by an LSI chip, EMC macro-model called LECCS model compose... [more] | EMCJ2012-69 EST2012-53 pp.31-36 |
| EST, EMCJ, IEE-EMC [detail] | 2012-10-25 14:00 |
Miyagi | Tohoku Gakuin University(Tagajo Campus) | Modeling of single conductor transmission line and its excitation by external incident-field Takashi Hisakado, Kohe Shimizu, Osami Wada (Kyoto Univ.) EMCJ2012-70 EST2012-54 |
[more] | EMCJ2012-70 EST2012-54 pp.37-42 |
| EMCJ, EMD | 2012-07-20 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Bore Sighting Method and Its Simplification for Radiated Emission Measurement above 1 GHz Band Ikuya Minematsu (KEC), Tatsurou Horiuchi (Roland), Hiroshi Kitada (MURATA), Masaru Yoshiwara (RIKEN), Yukio Kajita (KITAGAWA INDUSTRIES), Tetsuya Nakamura (TOYO), Osami Wada (Kyoto), Hisashi Ninomiya (Roland) EMCJ2012-46 EMD2012-21 |
[more] | EMCJ2012-46 EMD2012-21 pp.31-36 |
| EMCJ | 2012-07-19 13:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Equivalent Circuit Models of Capacitance and Inductance at Resonance Based on Electric and Magnetic Energy Taiki Nishimoto, Rikiya Asai, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2012-34 |
In high-frequency circuits, conductive planes are preferably used to stabilize electric potential. However, their large ... [more] | EMCJ2012-34 pp.13-18 |
| EMCJ, IEE-EMC | 2012-06-22 10:30 |
Osaka | Osaka Univ. | Reduction of common-mode noise in power supply system using floting conductor in LSI package Tohlu Matsushima, Aihua Li (Kyoto Univ.), Yuichi Mabuchi (Hitachi Ltd.,), Osami Wada (Kyoto Univ.) EMCJ2012-22 |
[more] | EMCJ2012-22 pp.7-12 |
| EMCJ | 2011-07-14 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Analysis of High Frequency Currents Due to Functional Block Activity Depending on Programs and Data in Power Supply System of LSI Yukishige Sugimoto, Yoshiyuki Saito, Tohlu Matsushima, Osami Wada (Kyoto Univ.) EMCJ2011-48 |
The authers have developed an EMC macro-model, LECCS-core model, in order to simulate high frequency currents generated ... [more] | EMCJ2011-48 pp.25-30 |
| EMCJ, IEE-EMC | 2011-06-24 10:05 |
Kyoto | Kyoto Univ. | Package-Common-Mode Resonance Caused by Parasitic Capacitor between Package and Printed Circuit Board Tohlu Matsushima, Nobuo Hirayama, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2011-34 |
[more] | EMCJ2011-34 pp.1-6 |
| EMCJ, IEE-EMC | 2011-06-24 10:30 |
Kyoto | Kyoto Univ. | Fast method of extracting partial inductances at a package and a circuit board considering proximity structure alteration Taiki Nishimoto, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2011-35 |
[more] | EMCJ2011-35 pp.7-12 |
| CAS (2nd) |
2010-10-06 10:45 |
Chiba | Makuhari Messe | [Invited Talk]
Modeling of LSI and PCB for Power Intergity and EMC Design Osami Wada (Kyoto Univ.) |
[more] | |
| EMCJ | 2010-07-15 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain Teruyoshi Yamasaki, Hiroshi Tanaka, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2010-29 |
The authors have developed an EMC macro-model called LECCS model composed of a linear equivalent circuit and internal eq... [more] | EMCJ2010-29 pp.45-50 |
| EMCJ | 2010-07-15 16:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Time Domain Analysis of Single Conductor Line Using Propagating Line Current Yoshinobu Wada, Takashi Hisakado, Osami Wada (Kyotu Univ.) EMCJ2010-31 |
Today some well-known methods are used to analyze integrated electric circuits, such as the lamped element model, the di... [more] | EMCJ2010-31 pp.55-60 |
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