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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD 2015-08-24
10:20		 Kumamoto Kumamoto City Development of a compacted doubly nesting array in Narrow Scribe Line aimed at detecting soft failures of interconnect via
Hiroki Shinkawata, Nobuo Tsuboi (REL), Atsushi Tsuda (RSD), Shingo Sato (Kansai), Yasuo Yamaguchi (REL) SDM2015-58 ICD2015-27		 We introduce a new addressable test structure array using for mass production stage which is compacted doubly nesting ar... [more] SDM2015-58 ICD2015-27
pp.7-10
ICD, SDM 2006-08-18
12:05		 Hokkaido Hokkaido University A 65 nm Ultra-High-Density Dual-port SRAM with 0.71um2 8T-cell for SoC
Susumu Imaoka (Renesas Design), Koji Nii (Renesas Technology), Yasuhiro Masuda (Renesas Design), Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Motoshige Igarashi, Kazuo Tomita, Nobuo Tsuboi, Hiroshi Makino, Koichiro Ishibashi, Hirofumi Shinohara (Renesas Technology) 		We propose a new access scheme of synchronous dual-port (DP) SRAM that minimizes area of 8T-DP-cell and keeps cell stabi... [more] SDM2006-148 ICD2006-102
pp.133-136
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