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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 10:30 |
Hiroshima | Satellite Campus Hiroshima |  VLD2018-50 DC2018-36 |
[more] | VLD2018-50 DC2018-36 pp.83-88 |
| COMP, IPSJ-AL | 2018-05-26 14:00 |
Aichi | Nagoya Institute of Technology | Obstruction detection by asynchronous opaque robots using lights Adam Heriban, Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (Sorbonne Universite) COMP2018-5 |
[more] | COMP2018-5 pp.71-78 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2018-03-08 13:55 |
Shimane | Okinoshima Bunka-Kaikan Bldg. | CPSY2017-146 DC2017-102 |
Resistive RAM (ReRAM) is one of the most promising memory technologies due to its property such as high density, low-pow... [more] | CPSY2017-146 DC2017-102 pp.257-262 |
| DC | 2018-02-20 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Golden-Free Hardware Trojan Detection Technique Considering Intra-Die Variation Fakir Sharif Hossain, Tomokazu Yoneda, Michihiro Shintani, Michiko Inoue (NAIST), Alex Orailoglu (Univ. of California, San Diego) DC2017-84 |
High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through... [more] | DC2017-84 pp.43-48 |
| DC | 2017-12-15 15:55 |
Akita | Akita Study Center, The Open University of Japan | [Invited Talk]
Hardware Trojan detection based on side-channel analysis Michiko Inoue (NAIST) DC2017-76 |
A hardware Trojan, a malicious addition and/or modification to ICs, caused by outsourcing of design and/or manufacturin... [more] |
DC2017-76 pp.43-48 |
| SS, DC | 2017-10-20 10:00 |
Kochi | Kochi City Culture-plaza CUL-PORT | Efficient Self-Stabilizing 1-Maximal Matching Algorithm for Arbitrary Networks Michiko Inoue, Fukuhito Ooshita (NAIST), Sebastien Tixeuil (UPMC) SS2017-31 DC2017-30 |
We present a new self-stabilizing 1-maximal matching algorithm that works under the distributed unfair daemon for arbitr... [more] | SS2017-31 DC2017-30 pp.61-66 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2017-03-10 09:30 |
Okinawa | Kumejima Island | Pass/Fail Prediction in LSI Test Considering Fail Die Characteristics. Takazumi Sato, Michiko Inoue (NAIST) CPSY2016-144 DC2016-90 |
Various kinds of tests are applied to LSIs in several satages to ship only fully reliable products.However, a lot of kin... [more] | CPSY2016-144 DC2016-90 pp.291-296 |
| DC | 2016-12-16 13:00 |
Yamagata | Sakata Sogo-Bunka Center(Sakata-City) | High Reliable Memory Architecture with Adaptive Combination of Aging-Aware In-Field Self-Repair and ECC Gian Mayuga, Yuta Yamato (NAIST), Yasuo Sato (KIT), Michiko Inoue (NAIST) DC2016-64 |
[more] | DC2016-64 pp.1-6 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE (Joint) [detail] |
2016-11-30 11:45 |
Osaka | Ritsumeikan University, Osaka Ibaraki Campus | A Golden-IC Free Clock Tree Driven Authentication Approach for Hardware Trojan Detection Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST), Alex Orailoglu (UCSD) VLD2016-67 DC2016-61 |
Due to outsourcing of numerous stages of the IC manufacturing process in different foundries, security risks such as har... [more] | VLD2016-67 DC2016-61 pp.135-140 |
| DC, SS | 2016-10-27 11:50 |
Shiga | Hikone Kinro-Fukushi Kaikan Bldg. | Faster Wait-free Randomized Consensus with an Oblivious Adversary for MRSW Register Model Sen Moriya (Kindai Univ.), Michiko Inoue (NAIST) SS2016-20 DC2016-22 |
We consider wait-free randomized consensus algorithms with an oblivious adversary in asynchronous shared-memory system u... [more] | SS2016-20 DC2016-22 pp.13-18 |
| COMP | 2016-09-06 11:00 |
Toyama | Toyama Prefectural University | Gathering of mobile agents in Byzantine environments with authenticated whiteboards Masashi Tsuchida, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2016-15 |
We propose an algorithm for the gathering problem of mobile agents in Byzantine environments. The proposed algorithm can... [more] | COMP2016-15 pp.7-14 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2016-03-25 15:45 |
Nagasaki | Fukue Bunka Hall/Rodou Fukushi Center | A consideration on variation correction for fail prediction in LSI test Ryo Ogawa (NAIST), Yoshiyuki Nakamura (Renesas Semiconductor Package & Test Solutions), Michiko Inoue (NAIST) CPSY2015-158 DC2015-112 |
Recently, a test cost reduction using data mining has been attracted. It is expected to reduce the cost by predicting fa... [more] | CPSY2015-158 DC2015-112 pp.271-276 |
| DC | 2016-02-17 11:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Delay fault injection framework based on logic simulation with zero delay model Shinji Kawasaki, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-90 |
Fault injection is a technique to re-create faulty behavior of circuits and widely accepted method to evaluate soft erro... [more] | DC2015-90 pp.25-30 |
| DC | 2016-02-17 14:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Built-In Self-Test with Combination of Weighted Random Pattern and Reseeding Sayaka Satonaka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) DC2015-92 |
Built-In Self-Test (BIST) is widely used to reduce test cost. However, it is difficult to achieve high fault coverage wi... [more] | DC2015-92 pp.37-42 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 12:45 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | Scan Segmentation Approach to Magnify Detection Sensitivity for Tiny Hardware Trojan Fakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue (NAIST) VLD2015-38 DC2015-34 |
Outsourcing of IC fabrication components has initiated the potential threat of design tempering using hardware Trojans ... [more] | VLD2015-38 DC2015-34 pp.1-6 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 13:50 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | Background Sequence Generation for Neighborhood Pattern Sensitive Fault Testing in Random Access Memories Shin'ya Ueoka, Tomokazu Yoneda, Yuta Yamato, Michiko Inoue (NAIST) VLD2015-40 DC2015-36 |
The Neighborhood Pattern Sensitive Fault (NPSF) is widely discussed fault model for memories, and it occurs when a memor... [more] | VLD2015-40 DC2015-36 pp.19-24 |
| COMP | 2015-09-01 14:00 |
Nagano | A Silent Anonymous Self-Stabilizing Algorithm to Construct 1-Maximal Matching under the Distributed Daemon in Trees Yuma Asada, Fukuhito Ooshita, Michiko Inoue (NAIST) COMP2015-20 |
We propose a silent self-stabilizing 1-maximal matching algorithm for anonymous trees under a distributed unfair daemon.... [more] | COMP2015-20 pp.27-34 |
|
| DC | 2014-12-19 14:15 |
Toyama | Reliability of ECC-based Memory Architectures with Online Self-repair Capabilities Gian Mayuga, Yuta Yamato, Tomokazu Yoneda (NAIST), Yasuo Sato (Kyutech), Michiko Inoue (NAIST) DC2014-70 |
[more] | DC2014-70 pp.19-24 |
|
| DC | 2014-10-27 15:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An Efficient Silent Self-Stabilizing Algorithm to Solve 1-Maximal Matching in Anonymous Networks Yuma Asada, Michiko Inoue (NAIST) DC2014-23 |
We propose a new self-stabilizing 1-maximal matching algorithm which is silent and works for any anonymous networks with... [more] | DC2014-23 pp.11-16 |
| COMP | 2014-03-10 14:15 |
Tokyo | Randomized consensus algorithm using MRSW registers under oblivious adversary Satoru Nakajima, Michiko Inoue (NAIST) COMP2013-68 |
In this paper, we propose an efficient randomized consensus algorithm in distributed shared register model under an obli... [more] | COMP2013-68 pp.53-60 |
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