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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2014-08-05 13:55 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
Tr variance evaluation induced by probing pressure and its stress extraction methodology in 28nm High-K and Metal Gate process Takeshi Okagaki, Takumi Hasegawa, Hiroyuki Takashino, Masako Fujii, Atsushi Tsuda, Koji Shibutani, Yoshinori Deguchi, Miho Yokota, Kazunori Onozawa (Renesas) SDM2014-77 ICD2014-46 |
[more] |
SDM2014-77 ICD2014-46 pp.83-86 |
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