| IEICE Technical Committee Submission System Conference Schedule |
Online Proceedings [Sign in] Tech. Rep. Archives |
All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| MW (2nd) |
2015-08-06 - 2015-08-08 |
Overseas | Chulalongkorn Univ., Bangkok, Thailand | Permittivity measurement of low-loss material by installation into microwave cavity Yuto Kato, Masahiro Horibe (AIST) |
Nonuniform fields resulted from a insertion slot decrease the accuracy of permittivity measurement by cavity method. A c... [more] | |
| MW | 2015-05-29 10:10 |
Tokyo | The Univ. of Electro-Commun. | Impact of Cable Flexure on Waveguide Vector Network Analyzer Measurements in Millimeter-wave and Tera Hertz Frequencies Masahiro Horibe, Ryoko Kishikawa, Yuto Kato (AIST)  MW2015-29 |
[more] | MW2015-29 pp.49-53 |
| MW | 2015-05-29 10:40 |
Tokyo | The Univ. of Electro-Commun. | A study of uncertainty estimation for time-domain analysis by considering S-parameter uncertainty Yuto Kato, Masahiro Horibe (AIST) MW2015-30 |
We have developed a new algorithm of the Monte-Carlo calculation for the uncertainty evaluation of time-domain measureme... [more] | MW2015-30 pp.55-60 |
| MW | 2015-05-29 11:10 |
Tokyo | The Univ. of Electro-Commun. | New Testing Technique for Impedance of Artificial Mains Network
-- Method for Obtaining Reliable Result without Rigorous Analysis of Measuring Instrument -- Ryoko Kishikawa, Masahiro Horibe (AIST) MW2015-31 |
There are some regulations about impedance of an artificial mains network which is a kind of EMC test instruments. CISPR... [more] | MW2015-31 pp.61-66 |
| SDM, ED | 2015-02-05 14:40 |
Hokkaido | Hokkaido Univ. | Accuracy of Time Domain Charge Pumping Tokinobu Watanabe, Masahiro Hori (Univ. of Toyama), Toshiaki Tsuchiya (Shimane Univ.), Yukinori Ono (Univ. of Toyama) ED2014-140 SDM2014-149 |
The charge pumping (CP) is method that is used for analyzing interface defects. The CP method evaluates interface defect... [more] | ED2014-140 SDM2014-149 pp.13-16 |
| SDM, EID | 2014-12-12 14:15 |
Kyoto | Kyoto University | Crystallization of Germanium Film with (111) Orientation on Amorphous Substrate by Laser Annealing Toru Takao, Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) EID2014-26 SDM2014-121 |
Single-grain Germanium (Ge) on amorphous substrate is required to realize the flexible system on panel display. Stripe-p... [more] | EID2014-26 SDM2014-121 pp.67-71 |
| SDM, EID | 2014-12-12 17:00 |
Kyoto | Kyoto University | Atomic Layer Deposition of Al2O3 Film Utilizing Water Vapor Plasma Oxidation Tomoaki Umehara, Masahiro Horita, Koji Yoshitsugu, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) EID2014-36 SDM2014-131 |
In this paper, we reported Al2O3 insulation film deposited by atomic layer deposition(ALD) for application of GaN power ... [more] | EID2014-36 SDM2014-131 pp.119-123 |
| MW (2nd) |
2014-11-26 - 2014-11-28 |
Overseas | King Mongkut's Institute of Technology Ladkrabang (KMITL), Bangkok | [Poster Presentation]
Establishment of new method for calibrating impedance of test instrument with vector network analyzer Ryoko Kishikawa, Masahiro Horibe (NMIJ) |
NMIJ has been developed a new method for calibrating impedance of test instrument with vector network analyzer. Five spe... [more] | |
| MW | 2014-11-20 16:10 |
Nagasaki | Nagasaki Univ. | [Special Talk]
Report on 2014 IEEE MTT-S International Microwave Symposium Akimichi Hirota (Mitsubishi Electric), Masahiro Horibe (AIST), Masataka Ohira (Saitama Univ.), Takashi Shimizu (Utsunomiya Univ.), Keiichi Motoi (NEC), Ko Kanaya (Mitsubishi Electric) MW2014-134 |
This is a report on 2014 IEEE MTT-S International Microwave Symposium (IMS 2014) held at Tampa, Florida, USA on 1-6 June... [more] | MW2014-134 pp.57-63 |
| AP, PEM (2nd) |
2013-12-20 16:05 |
Okinawa | Nobumoto Ohama Memorial Hall (Ishigaki) | Evaluation of Lens Antenna Characteristics for Dielectric Property Measurement in W-band Michitaka Ameya, Satoru Kurokawa, Yuto Kato, Masahiro Horibe (AIST) |
[more] | |
| SDM | 2013-12-13 09:00 |
Nara | NAIST | Analysis of thermal-induced degradation in oxide thin-film transistor under pulse voltage stress Kahori Kise (NAIST), Shigekazu Tomai (Idemitsu Kosan), Yoshihiro Ueoka, Haruka Yamazaki, Satoshi Urakawa (NAIST), Koki Yano (Idemitsu Kosan), Dapeng Wang, Mamoru Furuta (Kochi Univ. of Tech.), Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2013-116 |
In recent years, transparent amorphous oxide semiconductor (TAOS), represented by a-InGaZnO have been reported. Because ... [more] | SDM2013-116 pp.1-5 |
| SDM | 2013-12-13 09:20 |
Nara | NAIST | Electrical characteristics of ALD-Al2O3 gate dielectric on n-GaN treated by high pressure water vapor annealing Koji Yoshitsugu, Tomoaki Umehara, Masahiro Horita, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2013-117 |
In this paper, we investigated the effect of high pressure water vapor annealing (HPWVA) as a post deposition annealing ... [more] | SDM2013-117 pp.7-11 |
| MW (Workshop) |
2013-12-02 - 2013-12-04 |
Overseas | King Mongkut's University of Technology North Bangkok, Thailand | Impact to the measurement uncertainty of dielectric permittivity from S-parameter measurement uncertainty in the Transmission/Reflection method Paiboon Yoiyod (KMITL), Yuto Kato, Michitaka Ameya, Masahiro Horibe (AIST), Monai Krairiksh (KMITL) |
This paper proposes an uncertainty estimation of the complex relative permittivity of the material from measurement unce... [more] | |
| MW (Workshop) |
2013-12-02 - 2013-12-04 |
Overseas | King Mongkut's University of Technology North Bangkok, Thailand | Reduction of uncertainty in permittivity measurements using the Transmission/Reflection method by optimizing a weighted factor Yuto Kato, Masahiro Horibe, Michitaka Ameya (AIST), Paiboon Yoiyod (KMITL) |
In measuring permittivity with the Transmission/Reflection (T/R) method, there are several calculation procedures to der... [more] | |
| EMCJ, ITE-BCT | 2012-03-16 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Research and Development of Measurement and Testing Technique for Line Impedance Stabilized Network/Artificial Mains Network (LISN/AMN)
-- Establishment of Reliable Measurement System -- Ryoko Kishikawa, Masahiro Horibe, Masaaki Shida (AIST) EMCJ2011-139 |
In recent years, demands of management and regulation for electromagnetic use are increasing due to the wide use of elec... [more] | EMCJ2011-139 pp.55-60 |
| MW | 2012-03-02 15:45 |
Saga | Saga University | Development of Vector Network Analysis Technique in the Frequency Range of Millimeter and Sub-millimeter Wave lengths Masahiro Horibe, Ryoko Kishikawa (AIST) MW2011-189 |
[more] | MW2011-189 pp.121-126 |
| ED, SDM | 2012-02-07 13:30 |
Hokkaido | [Invited Talk]
Deterministic-doped Silicon Devices and Their Quantum Transport Takahiro Shinada, Masahiro Hori (Waseda Univ.), Filipo Guagliardo (Politecnico di Milano), Yukinori Ono (NTT), Kuninori Kumagai, Takashi Tanii (Waseda Univ.), Enrico Prati (CNR) ED2011-142 SDM2011-159 |
[more] | ED2011-142 SDM2011-159 pp.1-5 |
|
| SDM | 2011-12-16 10:00 |
Nara | NAIST | Effect of High Pressure Water Vapor Annealing on the optical properties of ZnS-based inorganic EL phosphor Takuya Kontani, Mao Taniguchi, Masahiro Horita (NAIST), Nobuyoshi Taguchi (Image Tech Inc.), Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2011-132 |
ZnS-based inorganic EL has been widely studied for next generation display and illumination. In the inorganic EL devices... [more] | SDM2011-132 pp.1-5 |
| SDM | 2011-12-16 14:00 |
Nara | NAIST | Fabrication of 2D Photonic-Crystal by ZnO using Gel-Nanoimprint Process Min Zhang, Shinji Araki, Li Lu, Masahiro Horita, Takashi Nishida, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2011-140 |
In this research, 2D-photonic-crystal ZnO films were fabricated using sol-gel spin-coating and nanoimprint lithography (... [more] | SDM2011-140 pp.43-46 |
| SDM | 2011-07-04 16:40 |
Aichi | VBL, Nagoya Univ. | Simultaneous Crystallization of Double-Layered Si Thin Films and Fabciration of Thin Film Devices Masahiro Horita, Koji Yamasaki, Emi Machida, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) SDM2011-68 |
We investigate simultaneous crystallization of double-layered silicon thin films on glass substrates by means of green l... [more] | SDM2011-68 pp.103-108 |
[Return to Top Page]