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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS, VLD |
2023-03-01 11:25 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test Daisuke Goeda (KIT), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michihiro Shintani (KIT) VLD2022-74 HWS2022-45 |
[more] |
VLD2022-74 HWS2022-45 pp.7-12 |
HWS, VLD |
2023-03-02 13:25 |
Okinawa |
(Primary: On-site, Secondary: Online) |
[Memorial Lecture]
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62 |
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] |
VLD2022-91 HWS2022-62 p.109 |
VLD, HWS [detail] |
2022-03-08 09:55 |
Online |
Online |
Wafer-Level Characteristic Variation Modeling with Considering Discontinuous Effect Caused by Manufacturing Equipment Takuma Nagao (National Institute of Technology (KOSEN)), Michihiro Shintani (Nara Institute of Science and Technology), Ken'ichi Yamaguchi, Hiroshi Iwata (National Institute of Technology (KOSEN)), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michiko Inoue (Nara Institute of Science and Technology) VLD2021-92 HWS2021-69 |
Statistical methods for predicting the performance of large-scale integrated circuits (LSIs) manufactured on a wafer are... [more] |
VLD2021-92 HWS2021-69 pp.87-92 |
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