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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 44 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2015-01-27
15:30
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Accurate Prediction of PBTI Lifetime in N-type Fin-Channel High-k Tunnel FETs
Wataru Mizubayashi, Takahiro Mori, Koichi Fukuda, Yongxun Liu, Takashi Matsukawa, Yuki Ishikawa, Kazuhiko Endo, Shinichi Ohuchi, Junichi Tsukada, Hiromi Yamauchi, Yukinori Morita, Shinji Migita, Hiroyuki Ota, Meishoku Masahara (AIST) SDM2014-143
The positive bias temperature instability (PBTI) characteristics for n-type fin-channel tunnel FETs (TFETs) with high-k ... [more] SDM2014-143
pp.33-36
SDM 2015-01-27
16:20
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Scaling Breakthrough for Analog/Digital Circuits by Suppressing Variability and Low-Frequency Noise for FinFETs by Amorphous Metal Gate Technology
Takashi Matsukawa, Koichi Fukuda, Yongxun Liu, Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa, Kazuhiko Endo, Shinichi O'uchi, Shinji Migita, Wataru Mizubayashi, Yukinori Morita, Hiroyuki Ota, Meishoku Masahara (AIST) SDM2014-145
 [more] SDM2014-145
pp.41-44
SDM 2015-01-27
16:45
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Experimental Realization of Complementary p- and n- Tunnel FinFETs with Subthreshold Slopes of Less than 60 mV/decade and Very Low (pA/um) Off-Current on a Si CMOS Platform
Yukinori Morita, Takahiro Mori, Koichi Fukuda, Wataru Mizubayashi, Shinji Migita, Takashi Matsukawa, Kazuhiko Endo, Shinichi O'uchi, Yongxun Liu, Meishoku Masahara, Hiroyuki Ota (AIST) SDM2014-146
Complementary (p- and n-type) tunnel FinFETs operating with subthreshold slopes (SSs) of less than 60 mV/decade and very... [more] SDM2014-146
pp.45-48
ICD 2014-04-18
13:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Multigate FinFET Device and Circuit Technology for 10nm and Beyond
Meishoku Masahara, Kazuhiko Endo, Shin-ichi Ouchi, Takashi Matsukawa, Yongxun Liu, Shinji Migita, Wataru Mizubayashi, Yukinori Morita, Hiroyuki Ota (AIST) ICD2014-15
One of the biggest challenges for the VLSI circuits with 20-nm-technology nodes and beyond is to overcome the issue of a... [more] ICD2014-15
pp.77-82
SDM 2014-01-29
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Heated Ion Implantation Technology for Highly Reliable Metal-gate/High-k CMOS SOI FinFETs
Wataru Mizubayashi (AIST), Hiroshi Onoda, Yoshiki Nakashima (Nissin Ion Equipment), Yuki Ishikawa, Takashi Matsukawa, Kazuhiko Endo, Yongxun Liu, Shinichi Ouchi, Junichi Tsukada, Hiromi Yamauchi, Shinji Migita, Yukinori Morita, Hiroyuki Ota, Meishoku Masahara (AIST) SDM2013-138
The impact of heated ion implantation (I/I) technology on metal-gate (MG)/high-k (HK) CMOS SOI FinFET performance and re... [more] SDM2013-138
pp.13-16
MI 2014-01-27
13:30
Okinawa Bunka Tenbusu Kan Investigation on Classification of Benign and Malignant Masses on Mammograms by Use of Modified Local Ternary Pattern
Chisako Muramatsu, Min Zhang, Takeshi Hara (Gifu Univ), Tokiko Endo (Nagoya Medical Center), Hiroshi Fujita (Gifu Univ) MI2013-118
We have been investigating an image analysis method for assisting the differential diagnosis of breast masses on mammogr... [more] MI2013-118
pp.327-330
SDM, ICD 2013-08-01
09:25
Ishikawa Kanazawa University Performance Enhancement of Tunnel Field-Effect Transistors by Synthetic Electric Field Effect
Yukinori Morita, Takahiro Mori, Shinji Migita, Wataru Mizubayashi, Akihito Tanabe, Koichi Fukuda, Kazuhiko Endo, Takashi Matsukawa, Shin-ichi O'uchi, Yongxun Liu, Meishoku Masahara, Hiroyuki Ota (AIST) SDM2013-66 ICD2013-48
A synthetic electric field effect to enhance the performance of tunnel field-effect transistors (TFETs) is proposed. The... [more] SDM2013-66 ICD2013-48
pp.7-12
ICD, ITE-IST 2013-07-05
16:50
Hokkaido San Refre Hakodate A Study on 1/f Noise Characteristic in Independent-Double-Gate-FinFET
Hideo Sakai (Keio Univ.), Shin-ichi O'uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) ICD2013-43
In this work, we measured 1/f noise of Independent-Double-Gate- (IDG-) FinFET which has two independent gates. Flicker n... [more] ICD2013-43
pp.119-124
MI 2013-01-24
13:10
Okinawa Bunka Tenbusu Kan Improvement of automated method for detecting architectural distortion using assessment of fibroglandular breast tissue density on mammograms
Nami Yamada (Gifu Univ.), Tomoko Matsubara (Nagoya Bunri Univ.), Akinori Tsunomori (Konica Minolta MG), Takeshi Hara, Chisako Muramatsu (Gifu Univ.), Tokiko Endo (Nagoya Medical Center), Hiroshi Fujita (Gifu Univ.) MI2012-79
Architectural distortion is one of very important findings in interpreting breast cancer on mammograms. Therefore we hav... [more] MI2012-79
pp.89-94
SDM, ED
(Workshop)
2012-06-29
10:45
Okinawa Okinawa Seinen-kaikan [Invited Talk] Decomposition analysis of on-current variability of FinFETs
Takashi Matsukawa, Yongxun Liu, Kazuhiko Endo, Shinichi O'uchi, Meishoku Masahara (AIST)
 [more]
MI 2011-07-13
14:30
Hokkaido Hokkaido University Development of computer-aided classification system on mammograms and study on method of presenting CAD output
Tomoko Matsubara (Nagoya Bunri Univ), Takeshi Hara (Gifu Univ), Norimitsu Shinohara (GUMS), Takako Morita (NMC), Tae Niwa (Toyota Kosei Hosp), Tokiko Endo (NMC), Hiroshi Fujita (Gifu Univ) MI2011-46
Commercialized CAD (computer-aided detection) systems present only the output of the computer. If physicians understand ... [more] MI2011-46
pp.73-76
ICD 2011-04-19
10:55
Hyogo Kobe University Takigawa Memorial Hall 0.5-V FinFET SRAM Using Dynamic-Threshold-Voltage Pass Gates
Shin-ichi O'uchi, Kazuhiko Endo, Yongxun Liu, Takashi Matsukawa, Tadashi Nakagawa, Yuki Ishikawa, Junichi Tsukada, Hiromi Yamauchi, Toshihiro Sekigawa, Hanpei Koike, Kunihiro Sakamoto, Meishoku Masahara (AIST) ICD2011-11
This article presents a FinFET SRAM which salvages malfunctioned bits caused by random variation. In the presenting SRAM... [more] ICD2011-11
pp.59-63
SDM, ED 2011-02-23
16:30
Hokkaido Hokkaido Univ. A Study on Precise FinFET High Frequency Characteristic Evaluation Method
Hideo Sakai (Keio Univ.), Shinichi Ouchi, Takashi Matsukawa, Kazuhiko Endo, Yongxun Liu, Junichi Tsukada, Yuki Ishikawa, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Kunihiro Sakamoto, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) ED2010-198 SDM2010-233
In recent years, different research groups have been focusing on FinFET transistor research as an excellent replacement ... [more] ED2010-198 SDM2010-233
pp.37-42
MI 2011-01-20
11:30
Okinawa Naha-Bunka-Tembusu Development of an automated mass detection technique based on 3D features in whole-breast ultrasound images
Fukutaro Ishihara, Daisuke Fukuoka, Chisako Muramatsu, Takeshi Hara (Gifu Univ), Etsuo Takada (Dokkyo Medical Univ), Tokiko Endo (Nagoya Medical Center), Takako Morita (Chunichi Hospital), Hiroshi Fujita (Gifu Univ) MI2010-97
In breast cancer screening, a large amount of data is acquired from many patients. Therefore radiologists may overlook l... [more] MI2010-97
pp.87-91
ICD, SDM 2010-08-27
16:25
Hokkaido Sapporo Center for Gender Equality On the Gate-Stack Origin Threshold Voltage Variability in Scaled FinFETs and Multi-FinFETs
Yongxun Liu, Kazuhiko Endo, Shinich Ouchi (AIST), Takahiro Kamei (Meiji Univ.), Junichi Tsukada, Hiromi Yamauchi, Yuki Ishikawa (AIST), Tetsuro Hayashida (Meiji Univ.), Kunihiro Sakamoto, Takashi Matsukawa (AIST), Atsushi Ogura (Meiji Univ.), Meishoku Masahara (AIST) SDM2010-151 ICD2010-66
The threshold voltage (Vt) variability in scaled FinFETs with gate length down to 20 nm was systematically investigated.... [more] SDM2010-151 ICD2010-66
pp.149-154
PRMU, IE, MI 2009-05-28
14:00
Gifu Gifu Univ. Improvement of the automated detection for architectural distortion on mammograms
Yuuki Shibata (Gifu Univ.), Tomoko Matsubara (Nagoya Bunri Univ.), Takeshi Hara, Hiroshi Fujita (Gifu Univ.), Tokiko Endo (Nagoya Medical Center), Takuji Iwase (Cancer Institure Hospital) IE2009-21 PRMU2009-12 MI2009-12
We have been developing an automated detection method for architectural distortion that is difficult to diagnose breast ... [more] IE2009-21 PRMU2009-12 MI2009-12
pp.65-68
MI 2009-01-19
14:05
Overseas National Taiwan University Development of whole breast ultrasound system with CAD function
Yuji Ikedo, Daisuke Fukuoka, Gobert Lee, Takeshi Hara, Hiroshi Fujita (Gifu Univ.), Etsuo Takada (Dokkyo Medical Univ.), Tokiko Endo (Nagoya Medical Center), Takako Morita (Chunichi Hospital) MI2008-66
We have developed a whole breast ultrasound (US) system for breast cancer screening. The system consisted of a whole bre... [more] MI2008-66
pp.41-42
MI 2009-01-21
15:15
Overseas National Taiwan University Computer-aided Detection for Spiculated Architectural Distortion on Mammograms
Tomoko Matsubara (Nagoya Bunri Univ.), Yuuki Shibata, Takeshi Hara, Hiroshi Fujita (Gifu Univ.), Tokiko Endo (Nagoya Medical Center), Takuji Iwase (Cancer Institute Hospital) MI2008-199
We have developed an automated detection method for architectural distortion that is difficult to diagnose breast cancer... [more] MI2008-199
pp.639-640
MI 2008-07-16
11:00
Hokkaido Sapporo Medical University Developments of category recognition system and comprehensive visualization in mammogram
Ryo Yoneyama, Takeshi Hara (Gifu Univ.), Tomoko Matsubara (Nagoya Bunri Univ.), Norimitsu Shinohara (GUMS), Takako Morita (Chunichi Hosp.), Tae Niwa (Nagoya Univ.), Tokiko Endo (Nagoya Medical Center), Hiroshi Fujita (Gifu Univ.) MI2008-19
Mammography is best role for the early detection of breast cancer. Because of this, it has been introduced in mass scree... [more] MI2008-19
pp.1-4
MI 2008-01-26
13:00
Okinawa Naha-Bunka-Tenbusu Automated detection for architectural distortion based on analysis of line structure in breast area on mammograms
Takanari Makita (Gifu Univ.), Tomoko Matsubara (Nagoya Bunri Univ.), Takeshi Hara, Hiroshi Fujita (Gifu Univ.), Tokiko Endo (Nagoya Medical Center), Takuji Iwase (Cancer Institute Hospital) MI2007-139
We have developed an automated detection method for architectural distortion that is difficult to diagnose breast cancer... [more] MI2007-139
pp.415-418
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