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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ, WPT
(Joint)
2016-01-29
13:05
Kumamoto Kumamoto National Colle. Technology Influence of Surface Roughness of Electrode in EM Radiation Caused by Micro Gap ESD
Kenichiro Abe, Ken Kawamata, Shigeki Minegishi (TGU), Osamu Fujiwara (NIT) EMCJ2015-118
Impulsive electromagnetic noise is caused by ESD. Especially, micro gap discharge of less than 1kV produces GHz band wid... [more] EMCJ2015-118
pp.83-86
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