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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD 2009-11-19
11:30		 Tokyo Nippon Institute of Technology, Kanda Campus, Tokyo, Japan The mechanism of a detailed surface transformation of fretting corrosion
Daiji Ito, Yosuke Miura, Yasushi Saitoh, Hirosaka Ikeda, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork technologies) EMD2009-75		  [more] EMD2009-75
pp.25-28
EMD, R 2009-02-20
11:05		 Mie Sumitomo Wiring Systems LTD., Head Office Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors
Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd) R2008-47 EMD2008-123		 Recently years, according to downsizing of connectors which applied to automobile, reductions of contact load in connect... [more] R2008-47 EMD2008-123
pp.19-24
EMD, R 2008-02-15
13:00		 Kyoto   Decomposition process of silicone and electrical contact failure -- Influence of silicone contamination on contact devices --
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT) R2007-61 EMD2007-116		  [more] R2007-61 EMD2007-116
pp.13-18
EMD 2007-11-14
09:50		 Shizuoka Actcity Hamamatsu Microscopic Observation of Fretting Corrosion of Tin Plated Contacts
Hirosaka Ikeda, Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori (AutoNetworks Technologies), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) EMD2007-70		 In recent years, the use of tin plated terminals in the automobile industry has accelerated due to increase in electroni... [more] EMD2007-70
pp.7-12
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