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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2021-11-12 14:30 |
Online |
Online |
[Invited Talk]
A Theoretical Study on Strain-Induced Change of Schottky Energy Barrier of Dumbbell-Shape Graphene-Nanoribbons for Highly Sensitive Strain Sensors Qinqiang Zhang, Ken Suzuki, Hideo Miura (Tohoku Univ.) SDM2021-64 |
The strain-induced change of electronic properties in the proposed dumbbell-shape graphene nanoribbon (DS- GNR) structur... [more] |
SDM2021-64 pp.60-65 |
SDM |
2019-02-07 13:50 |
Tokyo |
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[Invited Talk]
Grain-Boundary-Crystallinity Dependence of Mechanical Properties and EM Resistance of Electroplated Copper Interconnections Yifan Luo, Yutaro Nakoshi, Ryota Mizuno, Ken Suzuki, Hideo Miura (Tohoku Univ.) SDM2018-94 |
[more] |
SDM2018-94 pp.15-18 |
SDM |
2018-11-08 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Talk]
Development of the evaluation method of the strength of polycrystalline materials based on the order of atom arrangement and its application to the strength evaluation of electroplated copper thin films Ken Suzuki, Yifan Luo, Hideo Miura (Tohoku Univ.) SDM2018-68 |
[more] |
SDM2018-68 pp.23-26 |
SDM |
2015-03-02 14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
[Invited Talk]
Effect of microtexture in electroplated copper thin-film interconnections on their migration resistance Ken Suzuki, Takery Kato, Hideo Miura (Tohoku Univ) SDM2014-168 |
Both electrical and mechanical properties of electroplated copper thin-films vary drastically depending on their unique ... [more] |
SDM2014-168 pp.33-38 |
SDM |
2012-11-16 13:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Effect of a three-dimensional strain field on the electronic band structures of carbon nanotubes and graphene sheets Ken Suzuki, Masato Ohnishi, Hideo Miura (Tohoku Univ.) SDM2012-110 |
The prediction of the change in the conductivity of carbon nanotubes (CNTs) under strain is crucially important to assur... [more] |
SDM2012-110 pp.59-61 |
SDM |
2009-11-13 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Atomic Scale Analysis of the Degradation Mechanism of the Integrity High-k/Metal-gate Interface Caused by the Interaction between Point-Defects and Residual Strain around the Interface Ken Suzuki, Yuta Itoh, Tatsuya Inoue, Hideo Miura (Tohoku Univ.), Hideki Yoshikawa, Keisuke Kobayashi (National Inst. for Materials Science), Seiji Samukawa (Tohoku Univ.) SDM2009-149 |
Control of the interfacial crystallographic structure between a dielectric film and a gate electrode is one of the most ... [more] |
SDM2009-149 pp.79-84 |
ICD, CPM |
2007-01-18 16:35 |
Tokyo |
Kika-Shinko-Kaikan Bldg. |
Local deformation and residual stress of thin chips stacked by flip chip structures Hideo Miura, Nobuki Ueta, Yuki Sato (Tohoku Univ.) |
[more] |
CPM2006-140 ICD2006-182 pp.67-72 |
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