|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SSS |
2014-12-16 15:00 |
Tokyo |
Shibaura Institute of Technology |
[Invited Talk]
Study on pharmaceutical Package Notation and Ease-of-Opening Yousuke Sanbayashi, Yudai Fushimi (TMCIT), Reina Miyazaki, Fumito Tsuchiya, Dai Okamoto (Fujimori Kogyo), Fumito Tsuchiya (IUHW) SSS2014-21 |
Japanese patients are increasingly opting to self-medicate and thus switching from prescription to over-the –count... [more] |
SSS2014-21 pp.13-16 |
EA, US (Joint) |
2012-01-26 13:00 |
Osaka |
Kansai Univ. |
Evaluation of Blind Speech Extraction for Speech Archiving of Poster Session Kodai Okamoto, Ryoichi Miyazaki, Hiroshi Saruwatari, Kiyohiro Shikano (NAIST) EA2011-107 |
In this report, we propose a 19-channel microphone array recording system used for blind speech extraction and diarizati... [more] |
EA2011-107 pp.19-24 |
SDM |
2009-12-04 09:40 |
Nara |
NAIST |
Reduction of interface state density in 4H-SiC MOS interface by incorporation of phosphorus atoms Dai Okamoto, Hiroshi Yano, Kenji Hirata, Tomoaki Hatayama, Takashi Fuyuki (NAIST) SDM2009-152 |
A change in the interface state density in 4H-SiC metal-oxide-semiconductor (MOS) structures by incorporation of various... [more] |
SDM2009-152 pp.5-10 |
SDM |
2008-12-05 14:10 |
Kyoto |
Kyoto University, Katsura Campus, A1-001 |
Electrical properties of 4H-SiC MOS devices fabricated on C-face with NO direct oxidation Yuki Oshiro, Dai Okamoto, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki (Nara Institute of Science and Technology) SDM2008-190 |
[more] |
SDM2008-190 pp.31-35 |
SDM |
2007-12-14 16:40 |
Nara |
Nara Institute Science and Technology |
Charge-Pumping Measurement on 4H-SiC nMOSFETs and pMOSFETs Dai Okamoto, Hiroshi Yano, Tomoaki Hatayama, Yukiharu Uraoka, Takashi Fuyuki (Nara Inst. Sci. Tech.) SDM2007-234 |
Charge-pumping measurements were conducted on n-channel and p-channel 4H-SiC MOSFET’s with and without NO annealing. The... [more] |
SDM2007-234 pp.51-54 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|