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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IT, ISEC, WBS |
2013-03-07 13:40 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Side Channel Security Evaluation of AES Software Implementation by Chosen-Input Method Shohei Saito, Takeshi Kishikawa, Tsutomu Matsumoto (Yokohama National Univ.) IT2012-73 ISEC2012-91 WBS2012-59 |
[more] |
IT2012-73 ISEC2012-91 WBS2012-59 pp.71-78 |
IT, ISEC, WBS |
2013-03-07 14:30 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Impact of High-Speed Photodetector on Side Channel Attack through LED Pilot Lamp Shohei Saito, Tsutomu Matsumoto (Yokohama National Univ.) IT2012-75 ISEC2012-93 WBS2012-61 |
[more] |
IT2012-75 ISEC2012-93 WBS2012-61 pp.87-94 |
IT, ISEC, WBS |
2013-03-08 10:30 |
Osaka |
Kwansei Gakuin Univ., Osaka-Umeda Campus |
Laser Fault Injection Attack on Non-Decapped Contact Smart Card Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.) IT2012-93 ISEC2012-111 WBS2012-79 |
[more] |
IT2012-93 ISEC2012-111 WBS2012-79 pp.195-202 |
ISEC |
2012-12-12 14:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3 Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76 |
[more] |
ISEC2012-76 pp.29-36 |
ISEC, LOIS |
2012-11-21 14:15 |
Shizuoka |
Shizuoka City Industry-University Exchange Center |
How to Extract AES Key from Smart Card by Fault Injection Attack Using Electromaginetic Irradiataion Yuu Tsuchiya, Takeshi Kishikawa, Shohei Saito, Tsuyoshi Toyama (YNU), Akihiko Sasaki (MORITA TECH), Akashi Satoh (VDEC, Univ. Tokyo), Tsutomu Matsumoto (YNU) ISEC2012-57 LOIS2012-32 |
Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] |
ISEC2012-57 LOIS2012-32 pp.1-8 |
ISEC |
2012-09-21 16:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Pilot Lamps can Serve as Side Channels Shohei Saito, Tsutomu Matsumoto (Yokohama Nat'l Univ.) ISEC2012-54 |
Measuring microscopic variation of physical quantity such as power consumption or electromagnetic emanation of cryptogra... [more] |
ISEC2012-54 pp.51-58 |
ISEC |
2012-09-21 17:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
An Efficient Method of Strictly Evaluating Side-Channel Security Takeshi Kishikawa, Shohei Saito, Yuu Tsuchiya, Tsuyoshi Toyama, Tsutomu Matsumoto (Yokohama Nat'l Univ.) ISEC2012-56 |
Evaluation of side-channel security, i.e., resistance against side-channel attacks of cryptographic modules is definitel... [more] |
ISEC2012-56 pp.67-74 |
ISEC |
2011-09-09 14:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Can Pilot Lamps Serve as Side Channels? Tsutomu Matsumoto, Shohei Saito (YNU) ISEC2011-28 |
Measuring microscopic variation of power consumption or electromagnetic emanation of cryptographic hardware may be utili... [more] |
ISEC2011-28 pp.9-16 |
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