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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ICD, ITE-IST [detail] |
2018-08-09 12:45 |
Hokkaido |
Hokkaido Univ., Graduate School of IST M Bldg., M151 |
Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) SDM2018-47 ICD2018-34 |
[more] |
SDM2018-47 ICD2018-34 pp.109-113 |
ICD |
2012-12-18 10:20 |
Tokyo |
Tokyo Tech Front |
28-nm HKMG GHz Digital Sensor for Detecting Dynamic Voltage Drops in Testing for Peak Power Optimization Mitsuhiko Igarashi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita, Kan Takeuchi (Renesas Electronics) ICD2012-115 |
We propose a dynamic voltage-drop sensor, which is fully digital so that it is easy to design into products and use for ... [more] |
ICD2012-115 pp.97-102 |
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