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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS | 2024-04-19 16:00 |
Tokyo | (Primary: On-site, Secondary: Online) |
()  HWS2024-4 |
(To be available after the conference date) [more] | HWS2024-4 pp.14-17 |
| MW, EMCJ, EST, IEE-EMC [detail] | 2023-10-19 10:50 |
Yamagata | Yamagata University (Primary: On-site, Secondary: Online) |
Fundamental Study of Side-Channel Analysis Focusing on Backscattering from Switching Regulators Taiki Kitazawa, Kaji Shugo, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2023-40 MW2023-94 EST2023-67 |
(To be available after the conference date) [more] | EMCJ2023-40 MW2023-94 EST2023-67 pp.28-31 |
| EMM, BioX, ISEC, SITE, ICSS, HWS, IPSJ-CSEC, IPSJ-SPT [detail] | 2023-07-25 10:20 |
Hokkaido | Hokkaido Jichiro Kaikan | Takayuki Kondo, Taiki Kitazawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40 |
(To be available after the conference date) [more] | ISEC2023-40 SITE2023-34 BioX2023-43 HWS2023-40 ICSS2023-37 EMM2023-40 pp.171-175 |
| EMCJ, MW, EST, IEE-EMC [detail] | 2022-10-14 09:50 |
Akita | Akita University (Primary: On-site, Secondary: Online) |
Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI Seiya Takano, Shugo Kaji (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-53 MW2022-99 EST2022-63 |
The threats of electromagnetic (EM) information leakage induced by low-power intentional EM interference have been repor... [more] | EMCJ2022-53 MW2022-99 EST2022-63 pp.93-96 |
| HWS | 2022-04-26 13:30 |
Tokyo | AIST Tokyo Waterfront (Annex) (Primary: On-site, Secondary: Online) |
Fundamental Study on ID Generation Method Focusing on Distribution of Capacitance Sensor Output Values Shugo Kaji, Ayaki Tachikake, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2022-4 |
An individual identification using a capacitance sensor configured with a constant current source and an A/D converter i... [more] | HWS2022-4 pp.19-23 |
| VLD, HWS [detail] | 2022-03-08 16:10 |
Online | Online | Fundamental Evaluation Method for EM Information Leakage Caused by Hardware Trojans on Signal Cables
-- Impact of Modulation Factor and Emission Intensity -- Taiga Yukawa, Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) VLD2021-103 HWS2021-80 |
The threats of electromagnetic (EM) information leakage caused by hardware Trojans (HTs) implemented on signal cables ha... [more] | VLD2021-103 HWS2021-80 pp.153-157 |
| HWS, ICD [detail] | 2021-10-19 14:20 |
Online | Online | Fundamental Study on Hardware Trojan Detection on Cable Using On-chip Sensor Yo Nishitoba, Shugo Kaji (NAIST), Masahiro Kinugawa (Fukuchiyama Univ.), Daisuke Fujimoto, Yuichi Hayshi (NAIST) HWS2021-48 ICD2021-22 |
There have been reports of threats that cause information leakage by inserting Hardware Trojans (HT) into the connection... [more] | HWS2021-48 ICD2021-22 pp.38-42 |
| HWS, ICD [detail] | 2021-10-19 15:25 |
Online | Online | Fundamental Study on Individual Identification of Printed Circuit Boards Using Capacitance Sensors Ayaki Tachikake, Shugo Kaji, Daisuke Fujitomo, Yu-ichi Hayashi (NAIST) HWS2021-50 ICD2021-24 |
Individual identification technology using Physical Unclonable Functions (PUFs) guarantees the authenticity of semicondu... [more] | HWS2021-50 ICD2021-24 pp.49-52 |
| EMD | 2021-03-08 16:15 |
Online | Online | Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37 |
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] | EMD2020-37 pp.40-43 |
| EMD | 2020-12-04 15:50 |
Online | Online | Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24 |
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] | EMD2020-24 pp.34-38 |
| ICD, HWS [detail] | 2020-10-26 09:50 |
Online | Online | Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference
-- Impact of Impedance Change in Digital Output Circuits -- Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16 |
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] | HWS2020-27 ICD2020-16 pp.13-17 |
| EMCJ | 2020-07-02 15:20 |
Online | Online | Fundamental Evaluation of EM Information Leakage Caused by Intentional Electromagnetic Interference Shugo Kaji, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2020-15 |
The threat of electromagnetic (EM) information leakage has been focused on the acquisition of information inside the dev... [more] | EMCJ2020-15 pp.25-28 |
| HWS (2nd) |
2019-12-06 16:00 |
Tokyo | Asakusabashi Hulic Conference | [Poster Presentation]
Evaluation of Information Leakage Induced by IEMI from ICs with Multiple Data Communication Lines Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) |
[more] | |
| ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] | 2019-07-24 09:55 |
Kochi | Kochi University of Technology | Fundamental Study on an Estimation Method of Irradiate Frequencies to Forcibly Cause Electromagnetic Information Leakage Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43 |
The threats of electromagnetic (EM) information leakage from the input/output (I/O) signal of an IC mounted on a de-vice... [more] | ISEC2019-40 SITE2019-34 BioX2019-32 HWS2019-35 ICSS2019-38 EMM2019-43 pp.235-238 |
| HWS | 2019-04-12 15:55 |
Miyagi | Tohoku University | Fundamental Study on Suppression of Self-Interference Wave Caused by Intentional Information Leakage with IEMI Riho Kawakami, Shugo Kaji (NAIST), Masahiro Kinugawa (NIT, Sendai College), Diasuke Fujimoto, Yu-ichi Hayashi (NAIST) HWS2019-6 |
There is a threat of information leakage through unintentional electromagnetic (EM) emissions from equipment. The feasib... [more] | HWS2019-6 pp.31-35 |
| HWS, VLD | 2019-02-28 16:45 |
Okinawa | Okinawa Ken Seinen Kaikan | Fundamental Study on Individual Identification Method of Electronic Device Using Difference of Radiation Spectrum Caused by Manufacturing/Mounting Variations Shugo Kaji (NAIST), Masahiro kinugawa (NIT), Daisuke Fujimoto (NAIST), Laurent Sauvage, Jean-Luc Danger (Telecom ParisTech), Yu-ichi Hayashi (NAIST) VLD2018-120 HWS2018-83 |
There is a possibility that electronic devices which contain counterfeited/cloned ICs or electronic components cause ser... [more] | VLD2018-120 HWS2018-83 pp.163-167 |
| EMCJ | 2018-07-27 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fundamental Study on Data Injection Attacks Using a Hardware Trojan against ICT Devices Shugo Kaji (NAIST), Masahiro Kinugawa (NIT), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST) EMCJ2018-30 |
Intentional electromagnetic interference (IEMI) is a threat to destroy integrated circuits (ICs) or elements by using hi... [more] | EMCJ2018-30 pp.49-54 |
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