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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2014-11-28
15:10		 Oita B-ConPlaza A Method of Burn-in Fail Prediction of LSIs Based on Supervised Learning Using Cluster Analysis
Shogo Tetsukawa, Seiya Miyamoto, Satoshi Ohtake (Oita Univ.), Yoshiyuki Nakamura (Renesas) VLD2014-110 DC2014-64		 Production test of LSIs consists of several test phases such as wafer test phase, package test phase, burn-in test phase... [more] VLD2014-110 DC2014-64
pp.251-256
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