IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ITE-IDY, EID, SID-JC [detail] 2023-08-04
15:20
Online Online (Zoom) [Invited Talk] Development of backplane technologies for stretchable deformable display applications
Masashi Miyakawa, Hiroshi Tsuji, Tatsuya Takei (NHK), Toshihiro Yamamoto (NHK Foundation), Yoshihide Fujisaki, Mitsuru Nakata (NHK)
 [more]
SDM, OME 2020-04-14
11:10
Okinawa Okinawaken Seinen Kaikan
(Cancelled, technical report was not issued)
[Invited Talk] Development of oxide thin-film transistors for large-sized flexible displays
Hiroshi Tsuji, Mitsuru Nakata, Tatsuya Takei, Masashi Miyakawa, Yoshiki Nakajima, Takahisa Shimizu (NHK)
Large-screen flexible displays using plastic substrates are promising candidates for 8K TV for home use due to their sup... [more]
ITE-IDY, EID, IEE-EDD 2013-01-25
10:02
Shizuoka Shizuoka Univ. Development of Simulation Models for Oxide Thin-Film Transistors
Hiroshi Tsuji, Mitsuru Nakata, Hiroto Sato, Yoshiki Nakajima, Yoshihide Fujisaki, Tatsuya Takei, Toshihiro Yamamoto, Hideo Fujikake (NHK)
 [more]
SDM 2011-12-16
14:40
Nara NAIST Characterization and Modeling of Drain Overshoot Current in Poly-Si Thin Film Transistors
Toshifumi Ota, Hiroshi Tsuji, Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2011-142
Transient characteristics of drain current in poly-Si thin film transistors (TFTs) are investigated experimentally, and ... [more] SDM2011-142
pp.53-58
SDM 2009-12-04
11:20
Nara NAIST Characteristics of hot hole injection, trapping, and detrapping in gate oxide of poly-Si TFTs
Yoshinari Kamakura (Osaka Univ.), Takashi Himukashi (Osaka Univ./Kansai Univ.), Hiroshi Tsuji, Kenji Taniguchi (Osaka Univ.) SDM2009-157
The hysteresis observed in the transfer characteristics of n-channel poly-Si TFTs are experimentally investigated and po... [more] SDM2009-157
pp.35-38
SDM 2009-11-12
14:40
Tokyo Kikai-Shinko-Kaikan Bldg. Surface-Potential-Based Drain Current Model for Thin-Film Transistors
Hiroshi Tsuji (Osaka Univ/JST), Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2009-138
A new surface-potential-based drain current model for polycrystalline silicon thin-film transistors (poly-Si TFTs) is pr... [more] SDM2009-138
pp.19-22
SDM 2007-12-14
11:00
Nara Nara Institute Science and Technology Analysis of Capacitance-Voltage Characteristics of Poly-Si TFTs using Device Simulation
Tsuyoshi Kuzuoka, Hiroshi Tsuji, Masaharu Kirihara, Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2007-225
Capacitance-voltage characteristics of short channel Poly-Si TFTs containing only a single grain boundary were investiga... [more] SDM2007-225
pp.15-18
 Results 1 - 7 of 7  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan