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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2019-01-18 10:50 |
Osaka |
Osaka University |
Results of EMC round robin test on emission and immunity test.
-- (3) Conducted immunity round robin test -- Yoshitsugu Okuda (KEC Electronic Industry Development Center), Yasushi Asaji (Murata Manufacturing), Takashi Usui (YAMAHA), Mikio Okumura (OMRON), Kazuhiro Kobayashi (IPS), Hiroyoshi Shida (Tokin EMC Engineering), Hisashi Ninomiya (Roland), Mitsuyoshi Maishima (Hamamatsu Photonics), Osami Wada (Kyoto Univ) EMCJ2018-100 |
[more] |
EMCJ2018-100 pp.1-5 |
NC, MBE (Joint) |
2008-03-12 10:00 |
Tokyo |
Tamagawa Univ |
Gaussian Graphical Model on Scale-Free Network Takafumi Usui, Muneki Yasuda, Kazuyuki Tanaka (Tohoku Univ.) NC2007-112 |
We consider probabilistic inferences formulated by using Gaussian graphical models on scale free networks.
We can deriv... [more] |
NC2007-112 pp.1-5 |
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