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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 12:00 |
Tokyo |
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A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2019-90 |
With the complexity for VLSIs, transition fault testing is required. However, VLSIs generally have more untestable trans... [more] |
DC2019-90 pp.25-30 |
DC |
2019-02-27 13:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
State Assignment Method to Improve Transition Fault Coverage for Datapath Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.) DC2018-78 |
Recently, it is indispensable to test in transition fault model due to timing defects increase along with complication a... [more] |
DC2018-78 pp.43-48 |
DC |
2018-02-20 09:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Test Register Assignment Method for Operational Units to Reduce the Number of Test Patterns for Transition Faults Using Controller Augmentation Yuki Takeuchi, Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2017-78 |
It is required to reduce the number of test patterns to reduce test cost for VLSIs. Especially, design-for-testability m... [more] |
DC2017-78 pp.7-12 |
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