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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS 2018-04-13
11:35		 Fukuoka   Optical 3D Nano Artifact-metrics using White Light Interferometry
Naoki Yoshida (YNU), Yosuke Ueba, Shumpei Nishio, Yasuyuki Ohyagi (DNP), Morihisa Hoga (Compass21), Naoya Tate (KU), Makoto Naruse (NICT), Tsutomu Matsumoto (YNU) HWS2018-3		 We propose an artificial-metric system which authenticates nanostructures with random irregularities by means of an inte... [more] HWS2018-3
pp.11-16
HWS 2018-04-13
15:00		 Fukuoka   Discrimination of size and position of nanostructures embedded in MOSFET through drain current
Katsumi Shimizu (Hokkaido Univ.), Ueba Yosuke, Mitsuru Kitamura, Ohyagi Yasuyuki (DNP), Morihisa Hoga (Compass Two-One), Tate Naoya (Kyushu Univ.), Makoto Naruse (NICT), Tsutomu Matsumoto (Yokohama Natl. Univ.), Seiya Kasai (Hokkaido Univ.) HWS2018-7		 (To be available after the conference date) [more] HWS2018-7
pp.35-39
OPE 2017-12-07
13:15		 Okinawa   [Poster Presentation] Implementation of compact non-scanning probe system for nano-photonic security
Yoshiaki Yagi, Shunsuke Nakashima, Naoya Tate (Kyushu Univ.) OPE2017-110		 (To be available after the conference date) [more] OPE2017-110
pp.107-109
OPE 2017-12-08
11:05		 Okinawa   Recent study on device applications of N-doped ZnO crystal processed by laser-assisted annealing
Naoya Tate (Kyushu Univ.) OPE2017-113		 (To be available after the conference date) [more] OPE2017-113
pp.121-124
LQE, LSJ 2017-05-25
13:30		 Ishikawa   Developments and discussions on surface current-induced spatial light modulation
Naoya Tate (Kyushu Univ.) LQE2017-2		 (To be available after the conference date) [more] LQE2017-2
pp.7-10
IT, ISEC, WBS 2013-03-08
11:45		 Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Nano Artifact-metrics based on Resist Collapsing
Tsutomu Matsumoto, Kenta Hanaki, Ryosuke Suzuki, Daiki Sekiguchi (Yokohama National Univ.), Morihisa Hoga, Yasuyuki Ohyagi (DNP), Makoto Naruse (NICT), Naoya Tate, Motoichi Ohtsu (Univ. of Tokyo) IT2012-96 ISEC2012-114 WBS2012-82		 Artifact-metrics is an automated method of utilizing physical artifacts based on their measurable intrinsic characterist... [more] IT2012-96 ISEC2012-114 WBS2012-82
pp.217-222
 Results 1 - 6 of 6  /   
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