|
|
|
|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
|
| Search Results: Conference Papers |
| Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
|
| Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
| ICD |
2017-04-21
13:50 |
Tokyo |
|
[Invited Lecture]
Embedded Memory and ARM Cortex-M0 Core Using 60-nm CAAC-IGZO FET Integrated with 65-nm Si CMOS
Tatsuya Onuki, Atsuo Isobe, Yoshinori Ando, Satoru Okamoto, Kiyoshi Kato (Semiconductor Energy Laboratory), T R Yew, Chen Bin Lin, J Y Wu, Chi Chang Shuai, Shao Hui Wu (United Microelectronics Corporation), James Myers (ARM), Klaus Doppler (Nokia Technologies), Masahiro Fujita (The Univ. of Tokyo), Shunpei Yamazaki (Semiconductor Energy Laboratory)  ICD2017-17 |
[more] |
ICD2017-17
pp.89-93 |
| ICD, SDM |
2014-08-04
15:45 |
Hokkaido |
Hokkaido Univ., Multimedia Education Bldg. |
[Invited Talk]
A 32-bit CPU with Zero Standby Power and 1.5-clock Backup/2.5-clock Restore Achieved by Utilizing a 180-nm Crystalline Oxide Semiconductor Transistor
Jun Koyama, Atsuo Isobe, Hikaru Tamura, Kiyoshi Kato, Takuro Ohmaru, Wataru Uesugi, Takahiko Ishizu, Kazuaki Ohshima, Yasutaka Suzuki, Naoaki Tsutsui, Tomoaki Atsumi, Yutaka Shionoiri, Yukio Maehashi (SEL), Masahiro Fujita (Univ. of Tokyo), Shunpei Yamazaki (SEL) SDM2014-70 ICD2014-39 |
A flip-flop achieving high-speed backup utilizing a Si transistor and long-term retention with zero standby power by mea... [more] |
SDM2014-70 ICD2014-39
pp.45-50 |
|
|
|
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|