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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS (2nd) |
2017-06-13 09:25 |
Aomori | Hirosaki University | A Study of Chosen Plaintexts Having Equivalent Probability Distribution to Population in Hamming Distance for Cost Reduction of Security Evaluation against Side-Channel Attacks Toshiaki Teshima, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) |
(Advance abstract in Japanese is available) [more] | |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-18 14:46 |
Overseas | Nanyang Technological University | [Poster Presentation]
Electromagnetic Information Leakage Analysis of Cryptographic IC in Correlation Power Analysis Yasunari Kumano, Yusuke Yano, Kengo Iokibe, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.)  EMCJ2017-10 |
We observed and analyzed electromagnetic information leakage of the Advanced Encryption Standard (AES) cryptographic cir... [more] | EMCJ2017-10 pp.7-8 |
| EMCJ | 2017-04-14 16:25 |
Tokyo | NTT Musashino R&D Center | Parameter Identification of A Noise-source Linear Equivalent Circuit of DC-DC Converter Yuhei Osaki, Yusuke Yano, Kengo Iokibe, Yositaka Toyota (Okayama Univ.) EMCJ2017-6 |
[more] | EMCJ2017-6 pp.29-34 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2016-10-21 09:00 |
Miyagi | Tohoku Univ. | Attempt for Determining Cryptographic Circuit Blocks Leaking Side-Channel Information Based on Internal Current Source
-- Examination with FPGA Implementation of AES Circuits -- Kengo Iokibe, Naoki Kawata, Yusuke Yano, Hiroto Kagotani, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-74 MW2016-106 EST2016-70 |
For efficient security enhancement of cryptographic ICs against side-channel attacks (SCAs), it is important to identify... [more] | EMCJ2016-74 MW2016-106 EST2016-70 pp.79-84 |
| EMCJ, IEE-EMC, IEE-MAG | 2016-06-02 13:36 |
Overseas | NTU, Taiwan | [Poster Presentation]
Investigation of Relationship between Signal-to-Noise Ratio of EM Information Leakage and Side-Channel Attacking Cost. Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2016-25 |
Attacking cost of side-channel attack (SCA) can increase by application of various countermeasures to electromagnetic (E... [more] | EMCJ2016-25 pp.23-24 |
| EMCJ | 2016-05-13 15:15 |
Hokkaido | Hokkaido University | Linear Equivalent Circuit Modeling of Power Converter Circuit for Condunted Disturbance Estimation
-- Impact of Trigger Timing on the modeling -- Yusuke Yano, Hiroki Geshi, Kengo Iokibe (Okayama Univ.), Tetsushi Watanabe (Industrial Technology Center of Okayama Prefecture), Yoshitaka Toyota (Okayama Univ.) EMCJ2016-16 |
We proposed a linear equivalent circuit model of power converter circuit for efficient reduction design of conducted EMI... [more] | EMCJ2016-16 pp.41-45 |
| EMCJ | 2012-04-20 15:35 |
Ishikawa | Kanazawa Univ. | RL Damper Circuit for Electoromagnetic Compatibility and Power Integrity of Integrated Circuits Ryosuke Yamagata, Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2012-8 |
Resonances of the parasitic impedance in power distribution network (PDN) increase power current in radio frequency that... [more] | EMCJ2012-8 pp.43-48 |
| EMCJ, IEE-EMC | 2011-10-28 13:50 |
Aomori | Hachinohe Grand Hotel | Insertion of Dumping Resistor to Reduce RF IC-Power-Current Peak Caused by Resonance due to Parasitic Impedance Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.) EMCJ2011-84 |
High-frequency current caused by simultaneous switching of digital gates which leaks toward the DC power supply into the... [more] | EMCJ2011-84 pp.29-34 |
| EMCJ | 2010-07-15 15:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2010-28 |
High-frequency current caused by simultaneous switching of digital gates can be increased with decoupling capacitors，bec... [more] | EMCJ2010-28 pp.39-44 |
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