|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2020-02-26 14:10 |
Tokyo |
|
A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92 |
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] |
DC2019-92 pp.37-42 |
DC |
2019-02-27 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] |
DC2018-73 pp.13-18 |
VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2018-12-06 10:55 |
Hiroshima |
Satellite Campus Hiroshima |
On the Generation of Random Capture Safe Test Vectors Using Neural Networks Sayuri Ochi, Kenichirou Misawa, Toshinori Hosokawa, Yukari Yamauchi, Masayuki Arai (Nihon Univ.) VLD2018-51 DC2018-37 |
Excessive capture power consumption at scan testing causes the excessive IR drop and it might cause test-induced yield l... [more] |
VLD2018-51 DC2018-37 pp.89-94 |
MI |
2016-01-19 17:30 |
Okinawa |
Bunka Tenbusu Kan |
Report on MICCAI 2015 Shouhei Hanaoka (Tokyo Univ.), Kenichi Karasawa (Nagoya Univ.), Hidekata Hontani (Nagoya Institute of Tech.), Xiangrong Zhou (Gifu Univ.), Yasushi Hirano (Yamaguchi Univ.), Masahiro Oda (Nagoya Univ.), Yoshitaka Masutani (Hiroshima City Univ.), Akinobu Shimizu (Tokyo Univ. of Agriculture and Technology), Kensaku Mori (Nagoya Univ.) MI2015-110 |
[more] |
MI2015-110 pp.177-182 |
MI |
2016-01-20 10:44 |
Okinawa |
Bunka Tenbusu Kan |
Automated organ localization based on anatomical landmark and its application to multi-atlas pancreas segmentation Kenichi Karasawa, Masahiro Oda (Nagoya Univ.), Takayuki Kitasaka (AIT), Syohei Hanaoka (Toyko Univ.), Yuichiro Hayashi, Yukitaka Nimura (Nagoya Univ.), Kazunari Misawa (Aichi Cancer Center), Michitaka Hujiwara, Kensaku Mori (Nagoya Univ.) MI2015-117 |
[more] |
MI2015-117 pp.215-220 |
SS |
2008-08-01 10:45 |
Hokkaido |
Future University-Hakodate |
Proposal and evaluation of an approach to find bugs using difference information of code clone detection tools Kenichi Sawa, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.) SS2008-24 |
Code clone has recently received a lot of attention. A code clone is a code fragment that has other similar or identical... [more] |
SS2008-24 pp.67-72 |
IT |
2008-05-16 16:20 |
Wakayama |
Wakayama University |
Fast quantization with lp norm to the An lattice Kenichiro Takizawa, Hideki Yagi, Tsutomu Kawabata (UEC) IT2008-6 |
$A_{n}$ lattice is one of the root lattices and used for uniform quantization of a space. For $l_{2}$ norm, Conway and S... [more] |
IT2008-6 pp.29-32 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|