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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM, ICD, ITE-IST [detail] 2018-08-09
12:45		 Hokkaido Hokkaido Univ., Graduate School of IST M Bldg., M151 Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) SDM2018-47 ICD2018-34		  [more] SDM2018-47 ICD2018-34
pp.109-113
SDM, ICD 2013-08-02
10:50		 Ishikawa Kanazawa University A 123uW Standby Power Technique with EM-Tolerant 1.8V I/O NMOS Power Switch in 28nm HKMG Technology
Kazuki Fukuoka, Ryo Mori, Akira Kato, Mitsuhiko Igarashi, Koji Shibutani, Takashi Yamaki, Koji Nii, Sadayuki Morita, Takao Koike (Renesas Electronics), Noriaki Sakamoto (Renesas Mobile) SDM2013-78 ICD2013-60		  [more] SDM2013-78 ICD2013-60
pp.65-69
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