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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2018-11-08
13:30		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Device Simulation of Reliability for Advanced Semiconductor Devices
Takamitsu Ishihara, Kazuya Matsuzawa, Takeshi Naito, Sadayuki Yoshitomi (TMC) SDM2018-67		  [more] SDM2018-67
pp.17-22
SDM 2016-11-10
15:40		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Simulation for Impact of ISFET Structure on Sensitivity
Kazuya Matsuzawa (Toshiba) SDM2016-83		  [more] SDM2016-83
pp.27-32
SDM 2011-11-10
13:50		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Comprehensive Understanding of Random Telegraph Noise with Physics Based Simulation
Yusuke Higashi, Nobuyuki Momo, Hisayo S. Momose, Tatsuya Ohguro, Kazuya Matsuzawa (Toshiba) SDM2011-118		 Physical modeling of transient and frequency domain noise simulation for random telegraph noise (RTN) is conducted, cons... [more] SDM2011-118
pp.17-20
CAS
(2nd)		 2010-10-06
09:45		 Chiba Makuhari Messe [Invited Talk] Impact of DFR simulation from device to circuit
Kazuya Matsuzawa, Daisuke Hagishima, Takamitsu Ishihara (Advanced LSI Technology Lab. TOSHIBA) 		Long term-reliability must be considered in the value of LSI as well as function and performance. Conventionally, the LS... [more]
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