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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, R | 2009-02-20 11:05 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd)  R2008-47 EMD2008-123 |
Recently years, according to downsizing of connectors which applied to automobile, reductions of contact load in connect... [more] | R2008-47 EMD2008-123 pp.19-24 |
| EMD, R | 2009-02-20 12:30 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Microscopy Study of Fretting Corrosion of the Tin Plated Contacts Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) R2008-48 EMD2008-124 |
[more] | R2008-48 EMD2008-124 pp.25-30 |
| EMD | 2008-11-15 14:00 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Electric Properties and Surface Conditions of Tin Plated Contact with Load Shinya Nakamura, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2008-76 |
Recently, besides usual driving, the performances of automotive have been diversified to need safety, comfort and so on ... [more] | EMD2008-76 pp.45-48 |
| EMD | 2008-11-15 14:20 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Study of Fretting Corrosion in Early Stage Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetwork Technologies) EMD2008-77 |
Recently, according to downsizing of connectors which applied to automobile, reductions of contact load in connectors ar... [more] | EMD2008-77 pp.49-52 |
| EMD | 2008-11-15 15:00 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Contact Mechanisms and Contact Resistance Charateristics of Solid Tin and Plated Tin Contacts.
-- Separation of crystal grains of tin palted and its effect on contact resistance -- Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks) EMD2008-78 |
[more] | EMD2008-78 pp.53-56 |
| EMD | 2008-11-16 09:00 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Prediction of resistance of electric contact with plated layer (1)
-- Theoretical analyses -- Shigeru Sawada, Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Terutaka Tamai (Mie Univ.) EMD2008-88 |
Electrical contacts are an important part of electrical circuits and many reliability problems are related to their fail... [more] | EMD2008-88 pp.93-96 |
| EMD | 2008-11-16 09:20 |
Miyagi | Tohoku Bunka Gakuin University (Sendai) | Prediction of resistance of electrical contact with plated layer(2)
-- Contact area by FEM analysis -- Kaori Shimizu (AutoNetworks Technologies, Ltd.), Shigeki Shimada (Sumitomo Electric Industries, Ltd.), Shigeru Sawada, Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2008-89 |
Electrical contacts are the most important parts of electrical circuits, and many reliability problems of the circuits a... [more] | EMD2008-89 pp.97-100 |
| EMD | 2008-10-17 14:25 |
Tokyo | Contact Resistance Characteristics of Soft Metals such as Sn, Al, In. Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AuoNetworks) EMD2008-62 |
Soft metal group such as Sn, Al and In is widely applied to connections, junctions and contacts. Since surfaces of the m... [more] | EMD2008-62 pp.13-18 |
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| EMD | 2008-10-17 15:25 |
Tokyo | Outline report of the 24th international conference on electrical contacts ICEC2008 (France) Kiyoshi Yoshida (NIT), Tasuku Takagi (Tohoku Univ.), Hiroshi Inoue (Akita Univ.), Terutaka Tamai (Mie Univ.), Koichiro Sawa (Keio Univ.), Yoshitada Watanabe (Kougakuin Univ.), Masanari Taniguchi (Touhoku Bunka Gakuen Univ.), Noboru Wakatsuki (Ishinomaki Senshu Univ.), Makoto Hasegawa (Chitose Inst. and Scie. Tech.), Yasuhiro Hattori (AutoNetworks Tech.), Tatsuo Kobayashi (Oki Sen. Dev.) EMD2008-64 |
This is the report of 24th International Conference on Electrical Contacts (ICEC2008/Sait-Malo, France) held from June 9... [more] | EMD2008-64 pp.25-30 |
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| EMD | 2008-04-18 14:00 |
Tokyo | NTT Musashino Research and Development Center | Singularity of Contact Resistance Chracteristics for Tin Contacts Terutaka Tamai, Katsunori Hotta, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech.) EMD2008-2 |
Abstract Plated Sn group is applied widely to connector contacts. Since surfaces of the Sn covered with its oxide films... [more] | EMD2008-2 pp.7-12 |
| EMD, R | 2008-02-15 13:00 |
Kyoto | Decomposition process of silicone and electrical contact failure
-- Influence of silicone contamination on contact devices -- Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT) R2007-61 EMD2007-116 |
[more] | R2007-61 EMD2007-116 pp.13-18 |
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| EMD, R | 2008-02-15 13:50 |
Kyoto | Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork) R2007-63 EMD2007-118 |
Recently, besides usual driving, the performances of automotive have been diversified to need safety, comfort and so on ... [more] | R2007-63 EMD2007-118 pp.25-30 |
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| EMD, R | 2008-02-15 14:15 |
Kyoto | Study of Behavior of Contact Resistance of Fretting Corrosion Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks) R2007-64 EMD2007-119 |
Recently, according to downsizing of connectors which applied to automobile, reductions of contact load in connectors ar... [more] | R2007-64 EMD2007-119 pp.31-36 |
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| EMD | 2007-11-14 09:30 |
Shizuoka | Actcity Hamamatsu | Frequency Influencing of Fretting Corrosion of Tin Plated Contacts Yasushi Saitoh, Naoyuki Sato, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori (AutoNetworks Technologies) EMD2007-69 |
In recent years, the request for miniaturization and reduction of weight of connectors to be mounted on automobile is ge... [more] | EMD2007-69 pp.1-6 |
| EMD | 2007-11-14 09:50 |
Shizuoka | Actcity Hamamatsu | Microscopic Observation of Fretting Corrosion of Tin Plated Contacts Hirosaka Ikeda, Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori (AutoNetworks Technologies), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) EMD2007-70 |
In recent years, the use of tin plated terminals in the automobile industry has accelerated due to increase in electroni... [more] | EMD2007-70 pp.7-12 |
| EMD | 2007-11-14 10:10 |
Shizuoka | Actcity Hamamatsu | Micro-structural Study of Fretting Contact caused by the difference of the tin plating thickness Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori (AutoNetworks Technologies), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) EMD2007-71 |
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the inc... [more] | EMD2007-71 pp.13-18 |
| EMD | 2007-11-15 10:25 |
Shizuoka | Actcity Hamamatsu | Contact Resistance Characteristics of Complex Structure Contacts for Contaminated Printed Circuit Board in SO2 Environment Terutaka Tamai, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetwork Technologies) EMD2007-87 |
Characteristics of conductive elastomer which is composed of silicone rubber and dispersed carbon black particles shows ... [more] | EMD2007-87 pp.109-114 |
| EMD | 2007-10-19 11:45 |
Kanagawa | Keio Univ. Hiyoshi Campus | Improvement of tribology and contact resistance performances of Ag-Pd alloy by Mg additive. Terutaka Tamai, Yasushi Saitoh, Kazuo Iida (Mie U.), Yasuhiro Hattori (AN Lab.) EMD2007-61 |
Ag-Pd alloy has been used as contacts for down sized relays. It is difficult to obtain enough closing and opening forces... [more] | EMD2007-61 pp.31-36 |
| EMD | 2007-01-23 15:30 |
Tokyo | An Overview of the 52nd IEEE Holm Conference on Electrical Contacts Junya Sekikawa (Shizuoka Univ.), Terutaka Tamai (Hyogo Univ. of Teacher Education), Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Koichiro Sawa (Keio Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Noboru Wakatsuki (Ishinomaki Senshu Univ.) |
An overview of the 52nd IEEE Holm Conference on Electrical Contacts is described [1]. The conference was held 25 - 27 Se... [more] | EMD2006-67 pp.19-24 |
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