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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2011-01-28 13:25 |
Tokyo | Japan Aviation Electronics Industry,Limited | Three-Dimensional Micro-Structural Study of Tin Plated Fretting Contacts Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (ANT)  EMD2010-136 |
Fretting corrosion, by which the contact resistance increases, is one of the typical problems occurred in automotive con... [more] | EMD2010-136 pp.5-10 |
| EMD | 2011-01-28 13:50 |
Tokyo | Japan Aviation Electronics Industry,Limited | Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137 |
It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] | EMD2010-137 pp.11-16 |
| EMD | 2010-11-11 13:45 |
Overseas | Xi'an Jiaotong University | Observations of Structural Transition of Tin Plated Fretting Contacts using FIB-SEM Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (AutoNetworks) EMD2010-82 |
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the inc... [more] | EMD2010-82 pp.65-68 |
| EMD | 2010-03-05 13:15 |
Kanagawa | Yokohama National University | Influence of Aging on Contact Resistance and Mechanical Characteristics of Tin Plated Contacts Yuichi Tominaga (Mie Univ.), Takuya Yamanaka (AutoNetworks Technologies, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2009-128 |
We kept tin plated specimens in the aging chamber heated at 100 degrees in order to grow oxidation film. Then we measure... [more] | EMD2009-128 pp.5-8 |
| EMD | 2010-03-05 16:05 |
Kanagawa | Yokohama National University | Influence of Paraffin on Contact Resistance of Sn and Au Contacts Keisuke Taniguchi, Masaru Takeshita, Kazuo Iida, Yasushi Saitoh (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2009-138 |
The decrease of force for insertion of the automotive connector is attempted along with advancement of the miniaturizati... [more] | EMD2009-138 pp.45-48 |
| EMD | 2010-03-05 16:20 |
Kanagawa | Yokohama National University | Effect of liquid paraffin for fretting corrosion Yosuke Miura, Daiji Ito, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetwork Technologies) EMD2009-139 |
Fretting corrosion is the serious problem with the miniaturization of the automotive connector. If fretting corrosion h... [more] |
EMD2009-139 pp.49-52 |
| EMD, R | 2010-02-19 15:20 |
Osaka | Observation of wear status of tin plating for automotive connector at initial stage of sliding Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) R2009-56 EMD2009-123 |
Tin plated contacts are widely used for common electrical contact due to the inexpensive and reliability. On the other h... [more] | R2009-56 EMD2009-123 pp.37-42 |
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| EMD, R | 2010-02-19 15:45 |
Osaka | Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124 |
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] | R2009-57 EMD2009-124 pp.43-48 |
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| EMD, R | 2010-02-19 16:35 |
Osaka | Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) R2009-59 EMD2009-126 |
Sn is a material often used as a plating material of electric contact, but the oxide layer is formed by exposure to air.... [more] | R2009-59 EMD2009-126 pp.53-57 |
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| EMD | 2009-11-19 10:30 |
Tokyo | Nippon Institute of Technology, Kanda Campus, Tokyo, Japan | Constriction resistance analysis of multi-contact spots Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies), Kazuo Iida (Mie Univ.) EMD2009-72 |
Many researchers have studied influences of contact shape, plating conditions, and surface roughness on constriction res... [more] | EMD2009-72 pp.13-16 |
| EMD | 2009-11-19 11:30 |
Tokyo | Nippon Institute of Technology, Kanda Campus, Tokyo, Japan | The mechanism of a detailed surface transformation of fretting corrosion Daiji Ito, Yosuke Miura, Yasushi Saitoh, Hirosaka Ikeda, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork technologies) EMD2009-75 |
[more] | EMD2009-75 pp.25-28 |
| EMD | 2009-11-20 14:50 |
Tokyo | Nippon Institute of Technology, Kanda Campus, Tokyo, Japan | Growth of oxide film on tin plated surface of connector contacts and it effect on contact resistance Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (ANTech), Terutaka Tamai (Mie Univ.) EMD2009-100 |
Tin plating has been applied widely to electrical connector contacts to save the cost. However, the tin plated surfaces ... [more] | EMD2009-100 pp.133-136 |
| EMD | 2009-11-20 15:10 |
Tokyo | Nippon Institute of Technology, Kanda Campus, Tokyo, Japan | Observation of Tin Plated Fretting Contacts using FIB-SEM Tetsuya Ito, Yoshiyuki Nomura, Yasuhiro Hattori (AutoNetworks Technologies) EMD2009-101 |
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the inc... [more] | EMD2009-101 pp.137-140 |
| EMD | 2009-10-30 16:15 |
Tokyo | Effect of real contact point on constriction resistance of apparent contact area Shigeru Sawada, Terutaka Tamai (Mie Univ,), Yasuhiro Hattori (AutoNetworks Technologyies, Ltd.), Kazuo Iida (Mie Univ,) EMD2009-65 |
Many researchers have studied influences of contact shape, plating conditions, and surface roughness on constriction res... [more] | EMD2009-65 pp.39-44 |
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| EMD | 2009-03-06 14:05 |
Tokyo | Kougakuin Univ. | Investigation of Environments for Connectors on Vehicle Jin Hirabayashi, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2008-138 |
Connectors for vehicle are used under very severe conditions and grow worse by temperature changes and vibrations when v... [more] | EMD2008-138 pp.17-20 |
| EMD | 2009-03-06 14:20 |
Tokyo | Kougakuin Univ. | Load - Resistance Characteristics of Contact Materials for Automobile Connectors Takuya Yamanaka, Masaru Iko, Tatuya Nagase, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.) EMD2008-139 |
Samples of tin plating used for the contact of automobile connector were aged at the high temperature, and those load &#... [more] | EMD2008-139 pp.21-24 |
| EMD | 2009-03-06 16:50 |
Tokyo | Kougakuin Univ. | Effect of liquid paraffin for fretting corrosion Masaki Nonogawa, Daiji Ito, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AutoNetworks Technologies.LTD.) EMD2008-147 |
Fretting corrosion happens with the miniaturization of the automotive connector, and it cause trouble. In this study, W... [more] |
EMD2008-147 pp.53-56 |
| EMD, R | 2009-02-20 09:50 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Contact resistance analysis of electric contact with tin or silver plated layer Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) R2008-44 EMD2008-120 |
[more] | R2008-44 EMD2008-120 pp.1-6 |
| EMD, R | 2009-02-20 10:15 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry -- Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) R2008-45 EMD2008-121 |
[more] | R2008-45 EMD2008-121 pp.7-12 |
| EMD, R | 2009-02-20 10:40 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.) R2008-46 EMD2008-122 |
We kept tin plated specimens in the aging chamber heated at 100 ℃ in order to grow oxidation film. Then we measured cont... [more] | R2008-46 EMD2008-122 pp.13-18 |
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