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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, CPSY |
2015-12-18 09:00 |
Kyoto |
Kyoto Institute of Technology |
Evaluation of Soft Error Tolerance of Redundant Flip-Flop in 65nm Bulk and FD-SOI Processes. Eiji Sonezaki, Kubota Kanto, Masaki Masuda, Shohei Kanda, Jun Furuta, Kazutoshi Kobayashi (KIT) ICD2015-83 CPSY2015-96 |
According to process down scaling, LSI becomes less reliable for soft errors. To increase the tolerance of FFs for soft ... [more] |
ICD2015-83 CPSY2015-96 pp.69-74 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-26 11:35 |
Oita |
B-ConPlaza |
Voltage Dependence of Single Event Transient Pulses on 65nm Silicon-on-Thin-BOX and Bulk Processes Eiji Sonezaki, Kuiyuan Zhang, Jun Furuta, Kazutoshi Kobayashi (Kyoto Inst. of Tech.) VLD2014-84 DC2014-38 |
Recently, the growth of power consumption has been serious by process
scaling. The lower voltage is most effective to i... [more] |
VLD2014-84 DC2014-38 pp.93-97 |
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