Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2015-07-09 10:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Influence on IC Operation by Internal Electric Field of Metal Enclosure during Radiated Immunity Testing Keisuke Nakamura, Kenji Sogo, Michiharu Yamada, Kouji Ichikawa (DENSO) EMCJ2015-32 |
[more] |
EMCJ2015-32 pp.7-12 |
EMCJ, IEE-EMC |
2013-12-20 15:50 |
Aichi |
Denso co. |
Estimation for 2r-port S-parameters by the r-Port Measurements Noboru Maeda, Shinji Fukui, Takashi Naoi (NIPPON SOKEN), Kouji Ichikawa (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2013-107 |
An estimation method of the 2r-port S-parameters for reciprocal circuits is presented. In this method, several known loa... [more] |
EMCJ2013-107 pp.55-60 |
EMCJ, IEE-EMC |
2012-12-14 15:15 |
Gifu |
Gifu Univ. |
Estimation of the 3-port S Parameters with 2-port Measurements and Its Application to the Immunity Testing System Noboru Maeda, Shinji Fukui (SOKEN), Kouji Ichikawa, Yukihiko Sakurai (DENSO), Toshikazu Sekine, Yasuhiro Takahashi (Gifu Univ.) EMCJ2012-98 |
An estimation method of the three-port S parameters for the reciprocal circuit is presented. In this method, a known loa... [more] |
EMCJ2012-98 pp.81-85 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 10:30 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
A LSI-Package-Board co-evaluation of Power noise in the Digital LSI Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ.) VLD2012-91 DC2012-57 |
Problems related with power noise in LSI system are getting prominent
because of the higher integration and lower $V_{d... [more] |
VLD2012-91 DC2012-57 pp.183-188 |
EMCJ |
2012-04-20 15:10 |
Ishikawa |
Kanazawa Univ. |
Integrated evaluation of on-board and on-chip power noise measurement results in digital LSI Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Makoto Nagata (Kobe Univ.) EMCJ2012-7 |
In recent LSI system designs, noise environment of LSI system is getting worse.
Therefore proper noise oriented design ... [more] |
EMCJ2012-7 pp.37-42 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 09:25 |
Miyazaki |
NewWelCity Miyazaki |
Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST) CPM2011-163 ICD2011-95 |
Power noise of an integrated circuit (IC) chip is dominantly characterized by the frequency-domain impedance of a chip-p... [more] |
CPM2011-163 ICD2011-95 pp.73-78 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-18 15:35 |
Fukuoka |
Kitakyushu Science and Research Park |
[Invited Talk]
PCB design technology for System LSI
-- EMC System Design -- Kouji Ichikawa (DENSO CORPORATION) CPM2008-93 ICD2008-92 |
Computerized vehicle electronic equipments increasingly require high performance LSI. EMC performance of these electroni... [more] |
CPM2008-93 ICD2008-92 pp.25-30 |
EMCJ |
2008-07-17 13:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Evaluation of Multiple Power-Supply Pin LECCS-core Model with Different Pattern Design Boards Ryota Higashi, Kengo Iokibe (Okayama Univ.), Takahiro Tsuda, Kouji Ichikawa, Katsumi Nakamura (DENSO CORP.), Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2008-33 |
We have proposed an EMC macro model, LECCS, to achieve fast simulations of RF power currents in IC/LSIs. The model consi... [more] |
EMCJ2008-33 pp.43-48 |
CPM, ICD |
2008-01-17 09:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg |
Integrated evaluation of on-chip power supply noise and off-chip electromagnetic noise on digital LSI Yuki Takahashi (Kobe Univ.), Kouji Ichikawa (Denso), Makoto Nagata (Kobe Univ.) CPM2007-129 ICD2007-140 |
[more] |
CPM2007-129 ICD2007-140 pp.5-10 |
EMCJ |
2006-12-15 10:30 |
Aichi |
Nagoya Institute of Technology |
EMI Model improvement taking LSI package structure into consideration Takahiro Tsuda, Takanori Uno, Kouji Ichikawa (DENSO) EMCJ2006-84 |
An LSI EMI model was used to analyze conducted emission noise in a PCB. This model has been problem that the accuracy o... [more] |
EMCJ2006-84 pp.19-24 |
EMCJ |
2006-12-15 13:10 |
Aichi |
Nagoya Institute of Technology |
Difference Reduction Effects of Ground Patterns on Conductive Noise Currents from PCB Tsuyoshi Maeno, Takanori Uno, Kouji Ichikawa (DENSO), Osamu Fujiwara (NIT) EMCJ2006-88 |
In this paper, for reducing conductive noise currents from electronic equipment for vehicles, we made a simulation and e... [more] |
EMCJ2006-88 pp.41-46 |
EMCJ |
2006-01-16 11:30 |
Fukuoka |
Kyushu University |
S-parametesr Modeling Method for Immunity Noise Test Instrumentations Masahito Hirayama, Noboru Maeda (SOKEN), Kouji Ichikawa, Masashi Inagaki, Yukihiko Sakurai (DENSO) |
[more] |
EMCJ2005-128 pp.7-10 |
EMCJ |
2005-09-09 13:15 |
Kyoto |
Kyoto University |
An Approach to Predict Conducted Noise Current Spectra from Electronics Equipments for Vehicles Tsuyoshi Maeno, Kouji Ichikawa, Takanori Uno, Masaki Miyamoto, Kenji Katoh (DENSO) |
In this paper we made an investigation for reducing electromagnetic emission radiated from electronic equipment for vehi... [more] |
EMCJ2005-72 pp.79-84 |
EMCJ |
2004-12-10 16:15 |
Aichi |
Nagoya Institute of Technology |
A Study on Measurement of LSI Immunity for PCB Analysis Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology) |
We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more] |
EMCJ2004-115 pp.77-82 |