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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, CPM |
2007-01-19 11:20 |
Tokyo |
Kika-Shinko-Kaikan Bldg. |
Improvement of layout analysis by connecting emission/OBIRCH analysis with CAD data Akira Shimase, Akihito Uchikado, Mitsuaki Saeki, Shinichi Watarai, Takeshi Suzuki, Toshiyuki Majima (Renesas), Kazuhiro Hotta, Hirotoshi Terada (HPK) |
[more] |
CPM2006-146 ICD2006-188 pp.97-102 |
ICD, CPM |
2005-01-27 13:00 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Analysis method of LSI open failure point Yasumaro Komiya, Shuji Kikuchi (PERL), Akira Shimase, Kazuya Mukogawa (Renesas) |
For the purpose of locating an open-failure point in recent LSIs of higher integration, we propose an analysis technique... [more] |
CPM2004-155 ICD2004-200 pp.1-6 |
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