IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
NLP 2011-03-11
16:35
Tokyo Tokyo University of Science A Study of Degradatuion Phenomenon of electrical Contacts by some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Tohru Ikeguchi (Saitama Univ.), Yoshihiko Horio (Tokyo Denki Univ.), Koichiro Sawa (Nippon Insti. of Tech.) NLP2010-196
The authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences o... [more] NLP2010-196
pp.187-192
EMD 2011-01-28
15:40
Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (1) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-141
Authors have studied the influence on electrical contact resistance by external micro-oscillation using a hammering osci... [more] EMD2010-141
pp.35-40
EMD 2011-01-28
16:05
Tokyo Japan Aviation Electronics Industry,Limited Degradation phenomenon of electrical contacts by a tapping device -- A tapping device for trial (2) --
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT) EMD2010-142
Authors have developed and made a handy "tapping device (TPD)" experimentally without a special stage for the inspection... [more] EMD2010-142
pp.41-46
EMD 2010-12-17
14:30
Tokyo Tamagawa University Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (14) --
Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Professor Emeritus Keio Univ/Nippon Inst. of Tech.) EMD2010-132
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] EMD2010-132
pp.17-22
EMD 2010-11-12
13:15
Overseas Xi'an Jiaotong University A study of Degradation Phenomenon of Electrical Contacts by Hammering Oscillating Mechanism -- Modeling (10) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2010-111
A mechanism which contributes oscillation toward electrical contacts by hammering oscillation mechanism (HOM) in the ver... [more] EMD2010-111
pp.185-188
EMD 2010-10-15
14:35
Tokyo NTT Musashino Research and Development Center Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-65
Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-65
pp.13-18
EMD, OPE, LQE, CPM 2010-08-26
09:20
Hokkaido Chitose Arcadia Plaza Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (9) --
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-26 CPM2010-42 OPE2010-51 LQE2010-24
pp.1-6
EMCJ, EMD 2010-07-16
12:35
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance (13) --
Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.) EMCJ2010-32 EMD2010-17
Authors studied the influence on contact resistance by micro-vibration to electrical contacts using hammering oscillatio... [more] EMCJ2010-32 EMD2010-17
pp.1-6
EMD, CPM, OME 2010-06-25
16:20
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Contact Resistance 12 --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (former Keio Univ/NIT) EMD2010-14 CPM2010-28 OME2010-33
Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-14 CPM2010-28 OME2010-33
pp.31-36
EMD, CPM, OME 2010-06-25
16:45
Tokyo Kikai-Shinko-Kaikan Bldg. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- Modeling of the sliding mechanism (1) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (former Keio Univ/NIT) EMD2010-15 CPM2010-29 OME2010-34
Authors measured increasing resistances on electrical contacts by means of sliding contact mechanism respectively on the... [more] EMD2010-15 CPM2010-29 OME2010-34
pp.37-42
EMD 2010-05-21
14:50
Akita Akita Univ. Degradation phenomenon of electrical contacts by hammering oscillating mechanism -- modeling of the oscillating mechanism (8) --
Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Masayoshi Kotabe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2010-4
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] EMD2010-4
pp.19-24
 Results 1 - 11 of 11  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan