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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2017-04-20
14:15		 Tokyo   [Invited Lecture] TLC NAND Flash Memory Control Techniques to Reduce Errors of Read-Hot and Cold Data for Data Centers
Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2017-6		 In cloud data centers, NAND flash memory stores both read-hot and cold data. This paper describes that the threshold vol... [more] ICD2017-6
pp.29-34
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Analysis of Read Disturb Error in NAND Flash Memory
Hikaru Watanabe, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2016-66 CPSY2016-72		 Recently, as cloud computing technology and Social Networking Service spread, the applications whose data is read locall... [more] ICD2016-66 CPSY2016-72
p.51
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Reduction of Data-Retention Error in TLC NAND Flash Memories
Yuichi Sato, Yoshiaki Deguchi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2016-76 CPSY2016-82		 The cost of NAND flash memory is reduced by scaling and multi-level cell technologies. However, the reliability of tripl... [more] ICD2016-76 CPSY2016-82
p.75
ICD, CPSY 2015-12-17
16:00		 Kyoto Kyoto Institute of Technology [Poster Presentation] Performance Evaluation of Solid-State-Drives (SSDs) by Considering the effect of Error-correcting code
Yusuke Yamaga, Tsukasa Tokutomi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-71 CPSY2015-84		 In the NAND flash memory based solid-state drives (SSDs), reliability is guaranteed by error correcting code (ECC). Conv... [more] ICD2015-71 CPSY2015-84
p.41
ICD, CPSY 2015-12-17
16:00		 Kyoto Kyoto Institute of Technology [Poster Presentation] Bit-Error Analysis in TLC NAND flash memories.
Yoshiaki Deguchi, Tsukasa Tokutomi, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-75 CPSY2015-88		 The capacity of NAND flash memory can be expanded by increasing the bit density. In particular, 3-bit/cell triple-level ... [more] ICD2015-75 CPSY2015-88
p.49
ICD 2015-04-16
15:15		 Nagano   [Invited Talk] Reliability enhancement techniques of TLC NAND Flash Solid-State Drives (SSDs) for archive and enterprise applications
Shogo Hachiya, Shuhei Tanakamaru, Tsukasa Tokutomi, Masafumi Doi, Yuta Kitamura, Senju Yamazaki, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2015-5		  [more] ICD2015-5
pp.21-26
ICD, CPSY 2014-12-01
15:15		 Tokyo Kikai-Shinko-Kaikan Bldg. [Poster Presentation] Reliability Evaluation of NAND Flash Memory
Atsuro Kobayashi, Shogo Hachiya, Masafumi Doi, Tsukasa Tokutomi, Ken Takeuchi (Chuo Univ) ICD2014-92 CPSY2014-104		  [more] ICD2014-92 CPSY2014-104
p.63
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