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Committee Date Time Place Paper Title / Authors Abstract Paper #
R, EMD, CPM, LQE, OPE 2017-08-31
14:20
Aomori   Suppression of SS-OCT thickness Measurement Value Drift by Adaptation to Central Wavelength Shift of Sweep Range
Masahiro Ueno, Takashi Sakamoto, Seiji Toyoda, Yuzo Sasaki, Joji Yamaguchi, Tadashi Sakamoto (NTT), Masatoshi Fujimoto, Mahiro Yamada (Hamamatsu Photonics K. K.), Eiichi Sugai, Toru Kodaira (NTT-AT) R2017-26 EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23
Swept source optical coherence tomography (SS-OCT) is a technique to capture tomographic images of moving objects at hig... [more] R2017-26 EMD2017-20 CPM2017-41 OPE2017-50 LQE2017-23
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