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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
ISEC 2013-12-11
14:55		 Tokyo Kikai-Shinko-Kaikan Bldg. The Process by which Faults are Injected on Smart Cards Attacked by an Electromagnetic Irradiation Experiment
Yuu Tsuchiya, Hitoshi Ono, Tsutomu Matsumoto (Yokohama National Univ.) ISEC2013-77		 Fault injection attack, inducing partial fault in a cryptographic module and extracting the inside key, has been conside... [more] ISEC2013-77
pp.25-31
IT, ISEC, WBS 2013-03-08
10:30		 Osaka Kwansei Gakuin Univ., Osaka-Umeda Campus Laser Fault Injection Attack on Non-Decapped Contact Smart Card
Hitoshi Ono, Yuu Tsuchiya, Tsuyoshi Toyama, Takeshi Kishikawa, Shohei Saito (Yokohama National Univ.), Akihiko Sasaki (MORITA TECH), Akashi Satoh (Univ. of Tokyo), Tsutomu Matsumoto (Yokohama National Univ.) IT2012-93 ISEC2012-111 WBS2012-79		  [more] IT2012-93 ISEC2012-111 WBS2012-79
pp.195-202
ISEC 2012-12-12
14:55		 Tokyo Kikai-Shinko-Kaikan Bldg. The YNU's Method for Acquiring Power-Consumption Traces Developed for DPA Contest v3
Tsutomu Matsumoto, Takeshi Kishikawa, Hitoshi Ono, Shohei Saito, Yuu Tsuchiya (Yokohama Nat'l Univ.), Akihiko Sasaki (MORITA TECH), Tsuyoshi Toyama (Yokohama Nat'l Univ.) ISEC2012-76		  [more] ISEC2012-76
pp.29-36
ISEC, IT, WBS 2011-03-04
11:40		 Osaka Osaka University Digital Watermark Method Using Extended Smear-Desmearing Transform and High-pass filter
Masataka Ohno, Toshiyuki Uto, Kenji Ohue (Ehime Univ.) IT2010-123 ISEC2010-127 WBS2010-102		 This paper proposes an digital watermark method using extended smear-desmearing transform and high-pass filter.In this m... [more] IT2010-123 ISEC2010-127 WBS2010-102
pp.367-372
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