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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, SDM |
2007-08-24 11:35 |
Hokkaido |
Kitami Institute of Technology |
An analysis of asymmetry and orientation dependence of n-MOSFETs Toshihiro Matsuda, Yuya Sugiyama, Hideyuki Iwata (Toyama Pref. Univ.), Takashi Ohzone (Okayama Pref. Univ.) SDM2007-161 ICD2007-89 |
n-MOSFETs with 8 different channel orientation and three kinds of process conditions were measured and symmetry of IDsat... [more] |
SDM2007-161 ICD2007-89 pp.113-116 |
ICD, SDM |
2006-08-18 09:00 |
Hokkaido |
Hokkaido University |
A Test Structure to Separately Analyze CMOSFET Reliabilities along The Channel Width Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Toshihiro Matsuda, Hideyuki Iwata (Toyama Pref. Univ.) |
A test structure with four kinds of MOSFETs(i.e., [A]([D]) with a short(long) channel-length all over the channel width,... [more] |
SDM2006-142 ICD2006-96 pp.99-104 |
ICD, SDM |
2005-08-18 13:50 |
Hokkaido |
HAKODATE KOKUSAI HOTEL |
A Test Structure to Analyze (Highly-Doped)/(Lightly-Doped)-Drain in LDD-type CMOSFET Takashi Ohzone (Okayama Pref. Univ.), Toshihiro Matsuda (Toyama Pref. Univ.), Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku (Okayama Pref. Univ.), Hideyuki Iwata (Toyama Pref. Univ.) |
A test structure to separately measure sheet resistances of highly-doped-drain (HDD) and lightly- doped-drain (LDD) in L... [more] |
SDM2005-137 ICD2005-76 pp.55-60 |
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