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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 22  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ITE-ME, ITE-IST, BioX, SIP, MI, IE [detail] 2024-06-07
13:15
Niigata Nigata University (Ekinan-Campus "TOKIMATE") Lightweight Object Detection Model for a Feature Extractable CMOS Image Sensor
Keiichiro Kuroda, Yudai Morikaku, Yu Osuka (Ritumeikan Univ), Ryuichi Ujiie, Daisuke Morikawa, Hideki Shima, Okura Syunsuke, Kota Yoshida (Ritumeikan Univ)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-02
10:10
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
A Small-Area and Highly-Linear Column Readout Circuit for LOFIC CMOS Image Sensor
Ryotaro Hotta, Shunsuke Okura, Ai Otani, Kazuki Tatsuta (Ritsmeikan), Ken Miyauchi, Han Sangman, Hideki Owada, Isao Takayanagi (Brillnics)
 [more]
BioX, SIP, IE, ITE-IST, ITE-ME [detail] 2023-05-19
15:15
Mie Sansui Hall, Mie University
(Primary: On-site, Secondary: Online)
Object Detection with Split Images Based on Signal Range for Single Exposure High Dynamic Range Image Sensors
Yuta Nakahigashi, Shunsuke Okura, Kota Yoshida, Yu Osuka (Ritsumeikan Univ.)
 [more]
BioX, SIP, IE, ITE-IST, ITE-ME [detail] 2023-05-19
15:45
Mie Sansui Hall, Mie University
(Primary: On-site, Secondary: Online)
On-Chip Data Reduction and Object Detection for a Feature Extractable CMOS Image Sensor
Yudai Morikaku (Ritsumeikan Univ.), Ryuichi Ujiie, Daisuke Morikawa, Hideki Shima, Kota Yoshida, Shunsuke Okura (Ritsumeikan Univ.)
 [more]
HWS 2023-04-14
15:35
Oita
(Primary: On-site, Secondary: Online)
Object Generation - Backdoor Attack against Object-Detection DNN Triggered by Fault Injection into MIPI
Takumi Takubo, Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2023-6
Backdoor attacks that induce misclassification by poisoning training data and adding specific patterns (trigger marks) t... [more] HWS2023-6
pp.20-25
HWS, ICD 2022-10-25
13:50
Shiga
(Primary: On-site, Secondary: Online)
Fundamental Study of Adversarial Examples Created by Fault Injection Attack on Image Sensor Interface
Tatsuya Oyama, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) HWS2022-36 ICD2022-28
Adversarial examples (AEs), which cause misclassification by adding subtle perturbations to input images, have been prop... [more] HWS2022-36 ICD2022-28
pp.35-40
HWS, ICD 2022-10-25
16:40
Shiga
(Primary: On-site, Secondary: Online)
A Study on Small Area HMAC-SHA256 Circuit suitable for CMOS Image Sensor
Yu Sekioka, Tatsuya Oyama, Hayato Tatsuno, Kota Yoshida, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ) HWS2022-42 ICD2022-34
In order to realize data integrity and authentication for the edge imaging devices and to prevent the image information ... [more] HWS2022-42 ICD2022-34
pp.70-75
VLD, HWS [detail] 2022-03-08
13:25
Online Online A Study on Small Area Circuits for CMOS Image Sensors with Message Authentication Codes (1) -- Drive Circuit and Pixel Array Configuration --
Yoshihiro Akamatsu, Hiroaki Ogawa, Tatsuya Oyama, Hayato Tatsuno, Yu Sekioka, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ) VLD2021-97 HWS2021-74
In edge AI, the information acquired by sensors is classified or recognized at the edge, and therefore, guaranteeing the... [more] VLD2021-97 HWS2021-74
pp.117-122
VLD, HWS [detail] 2022-03-08
13:50
Online Online A Study on Small Area Circuits for CMOS Image Sensor with Message Authentication codes (2) -- Code generation circuit --
Yu Sekioka, Hiroaki Ogawa, Hayato Tatsuno, Tatsuya Oyama, Yoshihiro Akamatsu, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ) VLD2021-98 HWS2021-75
In edge AI (Artificial Intelligence) computing, information acquired by sensors is processed with distributed IoT device... [more] VLD2021-98 HWS2021-75
pp.123-128
SDM, ICD, ITE-IST [detail] 2021-08-17
13:55
Online Online Study of an Event-Driven CMOS Image Sensor Using Deep Learning (1) -- Verification of Image Classification Using Low Bit-Resolution Feature Images --
Kohei Yamamoto, Kota Yoshida, Shunsuke Okura (Ritsumeikan Univ.)
 [more]
SDM, ICD, ITE-IST [detail] 2021-08-17
14:20
Online Online Study of an Event-Driven CMOS Image Sensor Using Deep Learning (2) -- An A/D Converter with Low-Resolution and Power-Saving Operation Mode --
Koshiro Itsuki, Shunsuke Okura (Ritsumeikan Univ.)
 [more]
SDM, ICD, ITE-IST [detail] 2021-08-17
14:45
Online Online Image Recognition of HDR Images with Dual Gain CMOS Image Sensor
Takuya Kitamura, Kota Yoshida, Tetsushi Ikeda (Ritsumeikan Univ.), Shinichi Ikenaga, Isao Takayanagi (Brillnics), Shunsuke Okura (Ritsumeikan Univ.)
 [more]
SDM, ICD, ITE-IST [detail] 2021-08-18
16:00
Online Online An Area Efficient Readout Circuit for CMOS Image Sensor with Lateral Overflow Integration Capacitor
Ai Otani, Shunsuke Okura (Ritsumeikan Univ.), Ken Miyauchi, Sangman Han, Hideki Owada, Isao Takayanagi (BRILLNICS)
 [more]
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2021-07-20
15:55
Online Online Evaluation of TRNG Using CMOS Image Sensor
Hayato Tatsuno, Tatsuya Oyama, Masayoshi Shirahata, Shunsuke Okura, Takeshi Fujino (Ritsumeikan Univ.) ISEC2021-26 SITE2021-20 BioX2021-27 HWS2021-26 ICSS2021-31 EMM2021-31
Recently, the number of IoT devices has been increasing rapidly, and cryptographic functions such as authentication, key... [more] ISEC2021-26 SITE2021-20 BioX2021-27 HWS2021-26 ICSS2021-31 EMM2021-31
pp.98-103
HWS, VLD [detail] 2021-03-04
13:00
Online Online Design of Area-Efficient Response Generator for CMOS Image Sensor PUF
Masanori Aoki, Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) VLD2020-82 HWS2020-57
(To be available after the conference date) [more] VLD2020-82 HWS2020-57
pp.79-84
HWS, VLD [detail] 2020-03-07
10:30
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Causes of Entropy Loss on Non-IID PUFs and their Entropy Estimations (1)
Mitsuru Shiozaki (Ritsumeikan Univ.), Yohei Hori (AIST), Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) VLD2019-138 HWS2019-111
Recently, evaluation items and evaluation schemes of Physically Unclonable Functions (PUFs) are discussed in internation... [more] VLD2019-138 HWS2019-111
pp.257-262
HWS, VLD [detail] 2020-03-07
10:55
Okinawa Okinawa Ken Seinen Kaikan
(Cancelled but technical report was issued)
Causes of Entropy Loss on Non-IID PUFs and their Entropy Estimations (2)
Mitsuru Shiozaki (Ritsumeikan Univ.), Yohei Hori (AIST), Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) VLD2019-139 HWS2019-112
Recently, evaluation items and evaluation schemes of Physically Unclonable Functions (PUFs) are discussed in internation... [more] VLD2019-139 HWS2019-112
pp.263-268
HWS
(2nd)
2019-12-06
16:00
Tokyo Asakusabashi Hulic Conference [Poster Presentation] Model Reverse-Engineering Attack using Correlation Power Analysis against Systolic Array Based Neural Network Accelerator
Kota Yoshida, Shunsuke Okura, Mitsuru Shiozaki, Takaya Kubota, Takeshi Fujino (Ritsumeikan Univ.)
 [more]
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
09:15
Ehime Ehime Prefecture Gender Equality Center A Study on Dependence between Performance Metrics of PUFs and the Number of Response Bits using PUF Numerical Model
Tatsuya Oyama, Masayoshi Shirahata, Mitsuru Shiozaki, Shunsuke Okura (Ritsumeikan Univ.), Yohei Hori (AIST), Takeshi Fujino (Ritsumeikan Univ.) ICD2019-33 IE2019-39
Recently, performance metrics of Physically Unclonable Function (PUF) are discussed toward international standardization... [more] ICD2019-33 IE2019-39
pp.25-30
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]
2019-11-15
09:40
Ehime Ehime Prefecture Gender Equality Center Modeling attacks against device authentication using CMOS image sensor PUF
Hiroshi Yamada, Shunsuke Okura, Mitsuru Shiozaki, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) ICD2019-34 IE2019-40
A CMOS image sensor physically unclonable function (CIS-PUF) for device authentication by the unique responses extracted... [more] ICD2019-34 IE2019-40
pp.31-36
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